Zobrazeno 1 - 10
of 262
pro vyhledávání: '"RE Dunin-Borkowski"'
Autor:
D Fricker, P Atkinson, X Jin, M Lepsa, Z Zeng, A Kovács, L Kibkalo, RE Dunin-Borkowski, BE Kardynał
Publikováno v:
Nanotechnology 34(14), 145601 (2023). doi:10.1088/1361-6528/acabd1
Nanotechnology 34(14), 145601 (2023). doi:10.1088/1361-6528/acabd1
Published by IOP Publ., Bristol
Published by IOP Publ., Bristol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2129e14424c9da74584cbcbefb749d85
Autor:
Cattaneo M; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany; 2nd Institute of Physics, RWTH Aachen University, 52074 Aachen, Germany., Müller-Caspary K; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany; Department of Chemistry and Centre for NanoScience, Ludwig-Maximilians-University Munich, Butenandtstr. 11, 81377 Munich, Germany. Electronic address: k.mueller-caspary@cup.lmu.de., Barthel J; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. Electronic address: ju.barthel@fz-juelich.de., MacArthur KE; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Gauquelin N; Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium., Lipinska-Chwalek M; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany; Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany., Verbeeck J; Electron Microscopy for Materials Science (EMAT), University of Antwerp, 2020 Antwerp, Belgium., Allen LJ; School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia., Dunin-Borkowski RE; Ernst Ruska Centre (ER-C), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2024 Dec; Vol. 267, pp. 114050. Date of Electronic Publication: 2024 Sep 18.
Autor:
Park J; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Dutta S; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Sun H; DENSsolutions B.V., Informaticalaan 12, Delft, 2628 ZD, Netherlands., Jo J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Karanth P; Department of Radiation Science and Technology, Delft University of Technology, Mekelweg 15, Delft, 2629JB, Netherlands., Weber D; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Durmus YE; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Dzieciol K; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Jodat E; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Karl A; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Kungl H; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Pivak Y; DENSsolutions B.V., Informaticalaan 12, Delft, 2628 ZD, Netherlands., Garza HHP; DENSsolutions B.V., Informaticalaan 12, Delft, 2628 ZD, Netherlands., George C; Dyson School of Design Engineering, Imperial College London, London, SW7 2AZ, UK., Mayer J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany.; Central Facility for Electron Microscopy (GFE), RWTH Aachen University, 52074, Aachen, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Basak S; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany., Eichel RA; Institute of Energy and Climate Research, Fundamental Electrochemistry (IEK-9), Forschungszentrum Jülich GmbH, 52425, Jülich, Germany.; Institute of Physical Chemistry, RWTH Aachen University, 52074, Aachen, Germany.
Publikováno v:
Small methods [Small Methods] 2024 Dec; Vol. 8 (12), pp. e2400081. Date of Electronic Publication: 2024 Apr 30.
Autor:
Ruffato G; Department of Physics and Astronomy 'G. Galilei', University of Padova, via Marzolo 8, Padova 35131, Italy.; Department of Information Engineering, University of Padova, via Gradenigo 6, Padova 35131, Italy., Beleggia M; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany., Rotunno E; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Viani L; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy.; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Rosi P; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Kavkani PH; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy.; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Chiari C; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy.; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Frabboni S; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy.; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Gazzadi GC; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Pozzi G; Dipartimento FIM, Università degli studi di Modena e Reggio Emilia, via G. Campi 213/A, Modena 41125, Italy., Bertoni G; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy., Tiemeijer P; Thermo Fisher Scientific, PO Box 80066, Eindhoven 5600 KA, The Netherlands., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich 52425, Germany., Grillo V; Istituto Nanoscienze, Consiglio Nazionale delle Ricerche, via G. Campi 213/A, Modena 41125, Italy.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2024 Nov 26. Date of Electronic Publication: 2024 Nov 26.
Autor:
Han L; Max Planck Institute for Sustainable Materials, Max-Planck-Straße 1, 40237, Düsseldorf, Germany. l.han@mpie.de., Peter NJ; Institute of Energy and Climate Research (IEK-2), Forschungszentrum Jülich, 52425, Jülich, Germany., Maccari F; Institute of Materials Science, Technical University of Darmstadt, 64287, Darmstadt, Germany., Kovács A; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Wang J; Institute of Energy and Climate Research (IEK-2), Forschungszentrum Jülich, 52425, Jülich, Germany., Zhang Y; Institute of Materials Science, Technical University of Darmstadt, 64287, Darmstadt, Germany., Xie R; Institute of Materials Science, Technical University of Darmstadt, 64287, Darmstadt, Germany., Wu Y; Max Planck Institute for Sustainable Materials, Max-Planck-Straße 1, 40237, Düsseldorf, Germany., Schwaiger R; Institute of Energy and Climate Research (IEK-2), Forschungszentrum Jülich, 52425, Jülich, Germany., Zhang H; Institute of Materials Science, Technical University of Darmstadt, 64287, Darmstadt, Germany., Li Z; School of Materials Science and Engineering, Central South University, 410083, Changsha, China., Gutfleisch O; Institute of Materials Science, Technical University of Darmstadt, 64287, Darmstadt, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Raabe D; Max Planck Institute for Sustainable Materials, Max-Planck-Straße 1, 40237, Düsseldorf, Germany.
Publikováno v:
Nature communications [Nat Commun] 2024 Nov 22; Vol. 15 (1), pp. 10119. Date of Electronic Publication: 2024 Nov 22.
Autor:
Mallick S; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France. sougata.physics@gmail.com.; Department of Physics and Nanotechnology, College of Engineering and Technology, SRM Institute of Science and Technology, Kattankulathur, Tamil Nadu, India. sougata.physics@gmail.com., Sassi Y; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Prestes NF; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Krishnia S; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Gallego F; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., M Vicente Arche L; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Denneulin T; Forschungszentrum Jülich, ER-C for Microscopy and Spectroscopy with Electrons, Jülich, Germany., Collin S; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Bouzehouane K; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Thiaville A; Laboratoire de Physique des Solides, CNRS, Université Paris-Saclay, Orsay, France., Dunin-Borkowski RE; Forschungszentrum Jülich, ER-C for Microscopy and Spectroscopy with Electrons, Jülich, Germany., Jeudy V; Laboratoire de Physique des Solides, CNRS, Université Paris-Saclay, Orsay, France., Fert A; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Reyren N; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France., Cros V; Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France. vincent.cros@cnrs-thales.fr.
Publikováno v:
Nature communications [Nat Commun] 2024 Oct 01; Vol. 15 (1), pp. 8472. Date of Electronic Publication: 2024 Oct 01.
Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaN.
Autor:
Ji K; Ernst Ruska Centrum (ER-C-1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, Jülich, 52425, Germany; Institut für Experimentalphysik IV E, RWTH Aachen University, Aachen, 52056, Germany. Electronic address: k.ji@fz-juelich.de., Schnedler M; Ernst Ruska Centrum (ER-C-1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, Jülich, 52425, Germany. Electronic address: m.schnedler@fz-juelich.de., Lan Q; Ernst Ruska Centrum (ER-C-1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, Jülich, 52425, Germany. Electronic address: q.lan@fz-juelich.de., Carlin JF; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland., Butté R; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland., Grandjean N; Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland., Dunin-Borkowski RE; Ernst Ruska Centrum (ER-C-1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, Jülich, 52425, Germany; Institut für Experimentalphysik IV E, RWTH Aachen University, Aachen, 52056, Germany., Ebert P; Ernst Ruska Centrum (ER-C-1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, Jülich, 52425, Germany. Electronic address: p.ebert@fz-juelich.de.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2024 Oct; Vol. 264, pp. 114006. Date of Electronic Publication: 2024 Jun 09.
Autor:
Rosi P; Institute of Nanosciences CNR-S3, via G.Campi 213, 41125 Modena, Italy.; FIM Department, University of Modena and Reggio Emilia, via G. Campi 213/A, 41125 Modena, Italy., Viani L; FIM Department, University of Modena and Reggio Emilia, via G. Campi 213/A, 41125 Modena, Italy., Rotunno E; Institute of Nanosciences CNR-S3, via G.Campi 213, 41125 Modena, Italy., Frabboni S; Institute of Nanosciences CNR-S3, via G.Campi 213, 41125 Modena, Italy.; FIM Department, University of Modena and Reggio Emilia, via G. Campi 213/A, 41125 Modena, Italy., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425 Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425 Jülich, Germany., Roncaglia A; Institute for Microelectronics and Microsystems-CNR, Via P. Gobetti, 101, 40129 Bologna, Italy., Grillo V; Institute of Nanosciences CNR-S3, via G.Campi 213, 41125 Modena, Italy.
Publikováno v:
Physical review letters [Phys Rev Lett] 2024 Sep 20; Vol. 133 (12), pp. 123801.
Autor:
Yang L; Beijing Key Laboratory of Microstructure and Property of Advanced Materials, College of Materials Science and Engineering, Beijing University of Technology, Beijing, 100124, China.; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425, Jülich, Germany., Savchenko AS; Peter Grünberg Institute, Forschungszentrum Jülich and JARA, 52425, Jülich, Germany., Zheng F; Spin-X Institute, Center for Electron Microscopy, School of Physics and Optoelectronics, State Key Laboratory of Luminescent Materials and Devices, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, South China University of Technology, Guangzhou, 511442, China., Kiselev NS; Peter Grünberg Institute, Forschungszentrum Jülich and JARA, 52425, Jülich, Germany., Rybakov FN; Department of Physics and Astronomy, Uppsala University, Box-516, Uppsala, SE-751 20, Sweden., Han X; Beijing Key Laboratory of Microstructure and Property of Advanced Materials, College of Materials Science and Engineering, Beijing University of Technology, Beijing, 100124, China.; Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China., Blügel S; Peter Grünberg Institute, Forschungszentrum Jülich and JARA, 52425, Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425, Jülich, Germany.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Sep; Vol. 36 (36), pp. e2403274. Date of Electronic Publication: 2024 Jul 24.
Autor:
Puthirath Balan A; Institute of Physics, Johannes Gutenberg University Mainz, Staudinger Weg 7, 55128, Mainz, Germany., Kumar A; Institute of Physics, Johannes Gutenberg University Mainz, Staudinger Weg 7, 55128, Mainz, Germany., Reiser P; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Vimal Vas J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Denneulin T; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Lee KD; Department of Physics, University of South Florida, Tampa, FL, 33620, USA., Saunderson TG; Institute of Physics, Johannes Gutenberg University Mainz, Staudinger Weg 7, 55128, Mainz, Germany.; Peter Grünberg Institut and Institute for Advanced Simulation, Forschungszentrum Jülich and JARA, 52425, Jülich, Germany., Tschudin M; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Pellet-Mary C; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Dutta D; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Schrader C; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Scholz T; Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569, Stuttgart, Germany., Geuchies J; Max Planck Institute for Polymer Research Mainz, Ackermannweg 10, 55128, Mainz, Germany., Fu S; Max Planck Institute for Polymer Research Mainz, Ackermannweg 10, 55128, Mainz, Germany., Wang H; Max Planck Institute for Polymer Research Mainz, Ackermannweg 10, 55128, Mainz, Germany., Bonanni A; Institute of Semiconductor and Solid-State Physics, Johannes Kepler University Linz, Altenberger Straße 69, Linz, 4040, Austria., Lotsch BV; Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569, Stuttgart, Germany., Nowak U; Department of Physics, University of Konstanz, Universitaetsstrasse 10, 78464, Konstanz, Germany., Jakob G; Institute of Physics, Johannes Gutenberg University Mainz, Staudinger Weg 7, 55128, Mainz, Germany., Gayles J; Department of Physics, University of South Florida, Tampa, FL, 33620, USA., Kovacs A; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425, Jülich, Germany., Maletinsky P; Department of Physics, University of Basel, Klingelbergstrasse 82, Basel, CH-4056, Switzerland., Kläui M; Institute of Physics, Johannes Gutenberg University Mainz, Staudinger Weg 7, 55128, Mainz, Germany.; Center for Quantum Spintronics, Department of Physics, Norwegian University of Science and Technology, Trondheim, 7491, Norway.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Aug; Vol. 36 (35), pp. e2403685. Date of Electronic Publication: 2024 Jul 12.