Zobrazeno 1 - 10
of 47
pro vyhledávání: '"R.W. Odom"'
Publikováno v:
International Journal of Mass Spectrometry and Ion Processes. 161:47-67
This paper presents results of a static secondary ion mass spectrometry (SSIMS) study of molecular, pseudo-molecular and structurally significant fragment ion peaks produced from an extensive list of biomolecules analyzed as neat residues and as comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b763bff06a650b7fc2a4a2f34eb0469
https://doi.org/10.1016/s0168-1176(96)04505-3
https://doi.org/10.1016/s0168-1176(96)04505-3
Publikováno v:
Materials Chemistry and Physics. 43:87-94
A major cause of semiconductor device failure is contamination of the device surface by particulate matters from process chemicals, airborne particles, or particles flaking off from process equipment. Particle sizes range from tens of micrometers to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0f7b21360867ac04bb4c8ba4d6cdb12
https://doi.org/10.1016/0254-0584(96)01606-9
https://doi.org/10.1016/0254-0584(96)01606-9
Autor:
J. LaGraff, M.L. Chan, Q. Y. Ma, R.W. Odom, J. Baniecki, H. Chan, J. Murduck, H. A. Wang, S. H. Hong
Publikováno v:
IEEE Transactions on Appiled Superconductivity. 7:2150-2152
Ion diffusion and gettering in YBCO oxides were studied, The experiment was carried out by implanting Si or Ni ions into epitaxial YBCO films and subsequently annealing the samples at different temperatures ranging from 450/spl deg/C to 1050/spl deg/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ed12bf6a71e55060a3b66e6d812852e
https://doi.org/10.1109/77.621018
https://doi.org/10.1109/77.621018
Autor:
R.W. Odom, M.L. Grossbeck
The mechanical properties of refractory metals such as vanadium are determined to a large extent by the interstitial impurities in the alloy. In the case of welding, interstitial impurities are introduced in the welding process from the atmosphere an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e6fc713620b7a4d9473bfd47a0cc3d4
https://doi.org/10.2172/654030
https://doi.org/10.2172/654030
Publikováno v:
MRS Proceedings. 345
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a surface analysis technique which provides a sensitive characterization of the elemental and molecular composition of the near-surface region (top few monolayers) of solid materials1. This
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5322235dbb6ad2af59b24d1089f6f13
https://doi.org/10.1557/proc-345-197
https://doi.org/10.1557/proc-345-197
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 54:1046-1047
The objective of this research is to develop imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) to characterize ultra-thin organic films on microscopic particles. An initial application is to evaluate the surface chemistry of polycycli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e007a2a09937fb22ae585be4c1d313b6
https://doi.org/10.1017/s042482010016769x
https://doi.org/10.1017/s042482010016769x
Publikováno v:
Journal of Physics B: Atomic and Molecular Physics. 8:1349-1366
A study of the autoionization of the SF6- ion has been performed using the technique of ion cyclotron resonance (ICR). This study utilizes the motion of charged particles in the trapping plate plane to effectively separate the SF6- ion and electron c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4660b959255f4e9b1fa66fdc46c9ee8f
https://doi.org/10.1088/0022-3700/8/8/026
https://doi.org/10.1088/0022-3700/8/8/026
Publikováno v:
Chemical Physics. 16:75-80
The dissociation of H+2, D+2 by lasers in a cross-beam experiment is studied. The kinetic energy spectra of the fragments show the vibrational structure of the primary molecular ions. A ruby laser with light polarization parallel to the ion beam dire
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c35bc83cc45355c9f4144ae34a0d9c54
https://doi.org/10.1016/0301-0104(76)89024-6
https://doi.org/10.1016/0301-0104(76)89024-6
Publikováno v:
International Journal of Mass Spectrometry and Ion Physics. 49:319-335
Field desorption mass spectra of thermally labile compounds are readily obtained using a new pulsed field desorption (PFD) time-of-flight (TOF) mass spectrometer. Ions are formed by applying a short high voltage pulse to the cathode of a field desorp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84a5c31375c7f8116a0857dc0f05f7b2
https://doi.org/10.1016/0020-7381(83)85082-7
https://doi.org/10.1016/0020-7381(83)85082-7
Publikováno v:
Chemical Physics Letters. 24:227-230
A new technique, which uses an ion cyclotron resonance mass spectrometer as an ion trap, is used to measure the autoionization rate of SF − 6 . In the present experiments, the SF − 6 ion current is followed from 5 μsec to 800 μsec. The results
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f18c51789b668d13ca523f25a68eb2cd
https://doi.org/10.1016/0009-2614(74)85438-2
https://doi.org/10.1016/0009-2614(74)85438-2