Zobrazeno 1 - 1
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pro vyhledávání: '"R.T. Ida"'
Autor:
R.T. Ida, W.F. Davis
Publikováno v:
Proceedings of the Bipolar Circuits and Technology Meeting.
A statistical bipolar IC simulation methodology that employs functional Gummel-Poon model parameters controlled by an independent set of process parameters extracted at a wafer probe is discussed. Fractional factorial screening and Box-Behnken experi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d532693a0a1a3ab0406a2d118451ff83
https://doi.org/10.1109/bipol.1989.69505
https://doi.org/10.1109/bipol.1989.69505
