Zobrazeno 1 - 10
of 67
pro vyhledávání: '"R.P. Livi"'
Autor:
Enos Picazzio, T. Matsuura, I. S. Kim, H.B. Livi Silvia, R.P. Livi, O. I. Bougaenko, A.N. Lebedev, I. A. Belenko
Publikováno v:
International Astronomical Union Colloquium. 167:66-69
A polarization analysis of E–limb prominences on November 3, 1994 is presented. Photometry and data reduction of 24 prominence pictures based on IDL software and Stokes–vector presentation and applied to Hα emission resulted in an accuracy of 1
Autor:
J.E. Ericson, Ch. Grimm-Leimsner, R.P. Livi, Chengru Shi, T. A. Tombrello, W. Wagner, F. Rauch
Publikováno v:
Journal of Non-Crystalline Solids. 144:224-230
The hydration of tektite glass is studied using the ^(15)N nuclear reaction technique to measure the hydrogen concentration profiles of polished and etched slices of an indochinite tektite which had been exposed to water at temperatures of 125–250
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :764-767
We describe the details and performance of a time-of-flight (TOF) spectrometer for application in heavy ion RBS. An energy resolution of better than 1% is achieved for ^(16)O and ^(35)Cl ions in the energy range between 3 and 15 MeV. Using ions with
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 47:148-154
We describe a time-of-flight spectrometer for heavy ion RBS. Start and stop signals for the flight time measurement are obtained by detecting the secondary electrons emitted from two thin foils traversed by the ions. MicroChannel plates are used to p
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 9:263-269
The total secondary electron emission (SEE) yield from the entrance and exit surfaces of thin carbon foils under fast ion (^(16)O, ^(19)F, ^(35)Cl) bombardment has been measured as a function of the ion energy and the ion beam current intensity. Usin
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 27:432-441
Nuclear resonant reaction analysis (NRRA) techniques for hydrogen depth profiling in solid materials have typically used ion beams of 19F at the resonance energy of 16.44 MeV and 15N at 6.385 MeV. We report here the study of hydrogen analysis and pro
Autor:
R.P. Livi
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :545-548
Enhancement in adhesion of thin Au films on vitreous SiO 2 and GaAs substrates was induced by a 35 C1 ion beam at energies between 6.5 and 21.0 MeV and doses from 10 12 ions/cm 2 to 10 15 ions/cm 2 . The enhanced adhesion was studied by using the “
The ion beam-enhanced adhesion of thin Au films on vitreous silica substrates was studied for a wide range of Cl ion beam doses for beam energies between 6.5 MeV and 21.0 MeV. Since the residual adhesion of Au on SiO_2 is low, the improved adhesion c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dcc697ca0dedf4866753a71cfef09fe0
https://resolver.caltech.edu/CaltechAUTHORS:WIEnimb1985
https://resolver.caltech.edu/CaltechAUTHORS:WIEnimb1985
Publikováno v:
MRS Proceedings. 157
We discuss the amorphization process of semicrystalline and oriented PET (Polytethyleneterephtal ate)) thin toils by ion beam irradiation. P decrease in the bombarded samples melting point and enthalpy of fusion in the bombarded samples, as analysed
Autor:
Thad Vreeland, C. R. Wie, Scott Paine, R.P. Livi, J. Y. Tang, T. A. Tombrello, Marcus H. Mendenhall
Publikováno v:
MRS Proceedings. 37
Thin gold films over GaAs wafers with different dopants (Cr, Si, Te, and Zn) were used to study the role of he substrate electronic properties in the electrical contact and adhesion modification induced by MeV/nucleon heavy ion bombardment. The enhan