Zobrazeno 1 - 10
of 49
pro vyhledávání: '"R.H.J.M. Otten"'
Autor:
R.H.J.M. Otten, L.P.P.P. van Ginneken
The goal of the research out of which this monograph grew, was to make annealing as much as possible a general purpose optimization routine. At first glance this may seem a straight-forward task, for the formulation of its concept suggests applicabil
Publikováno v:
ACSD
Scopus-Elsevier
Fundamenta Informaticae, 78(1), 35-74. IOS Press
Pure TUe
Scopus-Elsevier
Fundamenta Informaticae, 78(1), 35-74. IOS Press
Pure TUe
Multi-criteria optimisation problems occur naturally in many engineering practices. Pareto analysis has proven to be a powerful tool to characterise potentially interesting realisations of a particular engineering problem. It is therefore used freque
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::77b7ad0a568dc4466bcff9a9443c9a0d
https://doi.org/10.1109/acsd.2005.2
https://doi.org/10.1109/acsd.2005.2
Publikováno v:
ISLPED
Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, ISLPED '05, 8-10 August 2005, 311-314
STARTPAGE=311;ENDPAGE=314;TITLE=Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, ISLPED '05, 8-10 August 2005
Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, ISLPED '05, 8-10 August 2005, 311-314
STARTPAGE=311;ENDPAGE=314;TITLE=Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, ISLPED '05, 8-10 August 2005
The authors presented an on-chip, fully-digital, power-supply control system. The scheme consists of two independent control loops that regulate power supply variations due to semiconductor process spread, temperature, and chip's workload. Smart powe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::130db790b7fdf6193a03ac8eeb51d32a
https://doi.org/10.1145/1077603.1077677
https://doi.org/10.1145/1077603.1077677
Publikováno v:
Proceedings Design, Automation and Test in Europe Conference and Exhibition.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efb665e696cb53d9a57cce4a016c061c
https://doi.org/10.1109/date.2004.1269107
https://doi.org/10.1109/date.2004.1269107
Publikováno v:
Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2f9f03e76184ce61e3a03288c7a09c1
https://doi.org/10.1109/dac.1999.781365
https://doi.org/10.1109/dac.1999.781365
Autor:
R.H.J.M. Otten, S. Bruma
Publikováno v:
Twelfth Annual IEEE International ASIC/SOC Conference (Cat. No.99TH8454).
This paper presents a VHDL package, called VHDL-MOS, which allows the mixed-mode simulation of deep submicron CMOS circuits using an event-driven simulator. Digital gate-level descriptions can coexist with analog-like transistor-level descriptions in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91fcfcd042bd2c791a06512fe5f07608
https://doi.org/10.1109/asic.1999.806480
https://doi.org/10.1109/asic.1999.806480
Autor:
C.T. McMullen, R.H.J.M. Otten
Publikováno v:
1988., IEEE International Symposium on Circuits and Systems.
The following abstract problem is solved: given a two-terminal series-parallel (sp) graph, find an sp-equivalent graph in which the number of vertices with odd degree is minimum, where an sp-equivalence class consists of the graphs with the same seri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a22c6c17e11b2f4ef98d28244c2444d1
https://doi.org/10.1109/iscas.1988.15281
https://doi.org/10.1109/iscas.1988.15281
Autor:
M. Kraak, R.H.J.M. Otten
Publikováno v:
Proceedings EURO-DAC '92: European Design Automation Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fb2f57f4613e8af2335ae2e65fed84b
https://doi.org/10.1109/eurdac.1992.246235
https://doi.org/10.1109/eurdac.1992.246235
Publikováno v:
Proceedings of ICCAD 2003, November 9-13, San Jose, USA, 568-573
STARTPAGE=568;ENDPAGE=573;TITLE=Proceedings of ICCAD 2003, November 9-13, San Jose, USA
STARTPAGE=568;ENDPAGE=573;TITLE=Proceedings of ICCAD 2003, November 9-13, San Jose, USA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e99f1bee21eb620ca1bb387dbdc89fc7
https://research.tue.nl/nl/publications/b082a585-5b86-43a8-9de0-f96e47ab4f5b
https://research.tue.nl/nl/publications/b082a585-5b86-43a8-9de0-f96e47ab4f5b
Autor:
I. Karkowski, R.H.J.M. Otten
Publikováno v:
Proceedings ED&TC European Design and Test Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14b38667d551016a67cbe5875c344cb9
https://doi.org/10.1109/edtc.1996.494342
https://doi.org/10.1109/edtc.1996.494342