Zobrazeno 1 - 10
of 59
pro vyhledávání: '"R.G. van Welzenis"'
Autor:
HH Hidde Brongersma, S. N. Ermolov, V.G. Glebovsky, S. N. Markin, M. Sasaki, R.G. van Welzenis
Publikováno v:
Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 268(15), 2433-2436. Elsevier
A peculiarity in the backscattering of keV He+ ions by a well-ordered high-purity W(2 1 1) surface is reported. Besides the normal elastic binary collision peak and the low-energy tail due to backscattering in deeper layers, an extra peak is observed
Autor:
W. F. Chu, S. Wulff, Werner Weppner, A. W. Denier van der Gon, R.G. van Welzenis, M. de Ridder, HH Hidde Brongersma
Publikováno v:
Journal of Applied Physics. 92:3056-3064
a special precipitation method at a low temperature. The segregation to the outermost surface layer is dominated by impurities. The increased impurity levels are restricted to this first layer, which underlines the importance of the use of LEIS for t
Autor:
R.G. van Welzenis
Publikováno v:
Ionics. 5:13-19
Surfaces and interfaces play a dominant role in the performance of devices like fuel cells and membranes based on ionic materials. The LEIS technique offers a unique possibility to determine the composition of the outermost atomic layer, which is oft
Autor:
G.M. Christie, R.G. van Welzenis, HH Hidde Brongersma, F.P.F. van Berkel, L.J. van IJzendoorn, R.A.M. Bink, P.J. Scanlon
Publikováno v:
Solid State Ionics, 112(1-2), 123-130. Elsevier
The atomic composition of the outermost atomic layers of gadolinium-doped ceria, Ce 0.8 Gd 0.2 O 1.9 , was determined with Low Energy Ion Scattering (LEIS). Due to the surface sensitivity of this technique it was possible to determine that the outer
Autor:
R.H. Bergmans, M. van de Grift, R.G. van Welzenis, M. Bowker, HH Hidde Brongersma, S.M. Francis, A. W. Denier van der Gon
Publikováno v:
Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 85(1-4), 435-438. Elsevier
We have investigated the composition and structure of the outermost two layers of the Cu85Pd15(110) (2 × 1) surface using low-energy ion scattering. Time-of-flight forward scattering and recoiling measurements show that the surface is unreconstructe
Autor:
C.A. Severijns, J.-P. Jacobs, R.H. Bergmans, L.G.C. Buijs, R.G. van Welzenis, HH Hidde Brongersma, A.C. Kruseman
Publikováno v:
Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 68(1-4), 207-212. Elsevier
Low-energy (0.1-10 keV) ion scattering (LEIS) can be used to analyze the atomic composition of the outermost layer of a surface. Possibilities for quantification and in-depth information are discussed. Using a new type of energy analyzer (EARISS) whi
Publikováno v:
Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 64(1-4), 584-587. Elsevier
A new type of energy analyzer (EARISS) has been developed that makes a very efficient use of the back-scattered ions. This enables the use of extremely low ion doses ("static" conditions). For instance, a spectrum of an Au20Pd80 alloy could be obtain
Publikováno v:
Applied Physics A: Solids and Surfaces, A52(1), 19-27. Springer
InSb/CdTe heterostructures were grown by MBE, including a 10 layer “superlattice”. The structures were characterized by X-ray diffraction, van der Pauw measurements, and SNMS depth profiling. The interfaces widen because of interdiffusion and thr
Autor:
HH Hidde Brongersma, R.G. van Welzenis, J.G.A. Hölscher, E.G.F. Sengers, F.J.J.G. Janssen, O. van Kessel
Publikováno v:
Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 64(1-4), 593-595. Elsevier
Low-energy ion scattering (LEIS) is shown to be a convenient technique for measuring the diffusion coefficient of cesium in sodium borosilicate glass. A 3 keV 4He+ ion beam is first used to create an alkali depletion layer in the outermost 60 nm of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::837639fac82c436ced76410124c2170c
https://research.tue.nl/nl/publications/8bc37557-2585-4591-9302-9d7f57e889ff
https://research.tue.nl/nl/publications/8bc37557-2585-4591-9302-9d7f57e889ff
Publikováno v:
Equilibrium Structure and Properties of Surfaces and Interfaces ISBN: 9781461364993
Low Energy Ion Scattering (LEIS) provieles information on the composition and structure of surfaces. EARISS (Energy anel Angular Resolved Ion Scattering Spectrometer) is a new implementation of this technique. Because of its high detection efficiency
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7daa430878f03e4ddbefaa511f31327
https://doi.org/10.1007/978-1-4615-3394-8_14
https://doi.org/10.1007/978-1-4615-3394-8_14