Zobrazeno 1 - 10
of 41
pro vyhledávání: '"R.F. Peart"'
Autor:
J.R. Davis, John A. Kilner, Karen J. Reeson, C. D. Meekison, G.R. Booker, P.L.F. Hemment, Richard J. Chater, R.F. Peart
Publikováno v:
Journal of Applied Physics. 69:3503-3511
Transmission electron microscope studies have been made of (100) silicon wafers implanted at 500 °C with 200‐keV 14N+ ions to doses of either 0.25, 0.75, or 1.4×1018 cm−2. For all of these specimens, the as‐implanted wafers contained a buried
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::afd06535eb676ec1cc42254730d23dcb
https://doi.org/10.1063/1.348491
https://doi.org/10.1063/1.348491
Autor:
R.F. Peart, J.E. Mynard, C. Knowler, M.F. Yao, E. Pasztor, C. J. Richmond, P.L.F. Hemment, K.G. Stephens
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 6:100-105
The 400 keV research implanter at the University of Surrey has been designed, primarily, for the implantation of high doses of ions into samples of various size and geometry. This goal has been achieved by the use of the Freeman type source, a cylind
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed4a633a18d292781e490c03f833a128
https://doi.org/10.1016/0168-583x(85)90616-0
https://doi.org/10.1016/0168-583x(85)90616-0
Publikováno v:
Thin Solid Films. 161:333-342
The modelling of buried SiO 2 layer formation by high dose implantation is extended to simulate new experimental data. The experiments involved the implantation of two different oxygen isotopes ( 16 O and 18 O) followed by subsequent analysis by seco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b625b74690929c399c000ed971477738
https://doi.org/10.1016/0040-6090(88)90265-9
https://doi.org/10.1016/0040-6090(88)90265-9
Autor:
R.J. Chater, P.L.F. Hemment, R.F. Peart, M.F. Yao, John A. Kilner, R.P. Arrowsmith, K.G. Stephens
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 6:292-297
Silicon on insulator structures have been formed by implanting O+ and N+ ions into (100) silicon. The structures have been evaluated by RBS and SIMS techniques. In oxygen implanted substrates, the thickness and crystal quality of the surface layer is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ffbe8edb462351530958bdc12c36fe7
https://doi.org/10.1016/0168-583x(85)90648-2
https://doi.org/10.1016/0168-583x(85)90648-2
Autor:
R.F. Peart, J.R. Davis, Richard J. Chater, P.L.F. Hemment, R.P. Arrowsmith, Karen J. Reeson, John A. Kilner
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 15:214-217
In order to obtain more information about the formation of buried layers of insulating material, we have undertaken a series of experiments in which we added incremental doses of the stable isotope, 15N, as a tracer, during the ion beam synthesis of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1df224869e59a5b80a6429739342e379
https://doi.org/10.1016/0168-583x(86)90288-0
https://doi.org/10.1016/0168-583x(86)90288-0
Autor:
M.R. Taylor, E.A. Maydell-Ondrusz, John A. Kilner, R.P. Arrowsmith, P.L.F. Hemment, R.F. Peart, Richard J. Chater
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :293-298
The formation of buried SiO 2 layers by high dose oxygen implantation has been monitored by the implantation of 18O tracer atoms and subsequent analysis by negative ion SIMS. Exchange of 18O with matrix oxygen in the buried layer occurred for all exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4031a7d48faad77d37bbaea39bd9d556
https://doi.org/10.1016/0168-583x(85)90568-3
https://doi.org/10.1016/0168-583x(85)90568-3
Publikováno v:
Physical Review. 175:788-795
The diffusion coefficients of iron, using ${\mathrm{Fe}}^{59}$ as the radioactive tracer, and the isotope-effect parameter, using ${\mathrm{Fe}}^{55}$ and ${\mathrm{Fe}}^{59}$ as tracers, have been measured in vanadium over a temperature range of mor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e1567608b4d686ae5dd33629a703145
https://doi.org/10.1103/physrev.175.788
https://doi.org/10.1103/physrev.175.788
Publikováno v:
Acta Metallurgica. 10:519-523
The experiments described in this note were carried out as part of an investigation of diffusion in b.c.c. metals. The data are also of technical interest in view of the importance of refractory metals, including niobium and molybdenum, in current en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31c5c8e5a4b94ec6d74fdc83fb1e8b6a
https://doi.org/10.1016/0001-6160(62)90196-7
https://doi.org/10.1016/0001-6160(62)90196-7
Autor:
R.F. Peart
Publikováno v:
Journal of Physics and Chemistry of Solids. 26:1853-1861
Measurements have been made of tracer diffusion coefficients of V48 and Fe59 in single crystals of vanadium over the temperature range 840–1830°C. The V48 results show temperature dependent diffusion characteristics that are represented by activat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55da34067dfa8840c16961cc69c7eb56
https://doi.org/10.1016/0022-3697(65)90218-0
https://doi.org/10.1016/0022-3697(65)90218-0
Autor:
D.H Tomlin, R.F Peart
Publikováno v:
Acta Metallurgica. 10:123-134
A series of tracer diffusion experiments has been carried out in the b.c.c. phases of titanium and the two titanium based alloys Ti-Fe and Ti-Nb over the concentration range 0–15 at.% Fe or Nb. Together with the earlier work of Mortlock and Tomlin(
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85709851042abebdf4efc6ae032bf3cf
https://doi.org/10.1016/0001-6160(62)90057-3
https://doi.org/10.1016/0001-6160(62)90057-3