Zobrazeno 1 - 10
of 265
pro vyhledávání: '"R.C.G. Leckey"'
Autor:
R.C.G. Leckey, Florian Speck, Anton Tadich, J.D. Riley, Konstantin V. Emtsev, L. Broekman, Andrei Varykhalov, Alexander M. Shikin, Th. Seyller, Lothar Ley, Kun Yuan Gao, Oliver Rader
Publikováno v:
Surface Science. 600:3906-3911
Photoelectron spectroscopy, low-energy electron diffraction, and scanning probe microscopy were used to investigate the electronic and structural properties of graphite layers grown by solid state graphitization of SiC(0 0 0 1) surfaces. The process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32460f762ae6800b5d3e97a8902a4fd5
https://doi.org/10.1016/j.susc.2006.01.102
https://doi.org/10.1016/j.susc.2006.01.102
Autor:
R.C.G. Leckey, Konstantin V. Emtsev, Anton Tadich, Th. Seyller, M. Preuss, L. Broekman, J.D. Riley, Lothar Ley
Publikováno v:
Surface Science. 600:3845-3850
The properties of the clean and unreconstructed 6H–SiC(0 0 0 1) and 6H–SiC ( 0 0 0 1 ¯ ) surfaces were investigated by means of angle-resolved photoelectron spectroscopy (ARPES). These highly metastable surfaces were prepared by exposing hydroge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10c56c69604afa1a3f393d7101a021bf
https://doi.org/10.1016/j.susc.2006.01.094
https://doi.org/10.1016/j.susc.2006.01.094
Autor:
R.C.G. Leckey, Anton Tadich, J.D. Riley, A.E. Smith, Lothar Ley, L. Broekman, S. Homolya, Konstantin V. Emtsev, Thomas Seyller
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. :515-518
A second-generation toroidal spectrometer has been used to investigate the Fermi surface topology of the binary alloy system Cu 3 Au when prepared as an ordered or substitutionally disordered alloy. We demonstrate using two complementary Fermi surfac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::890af6d3c3d51508d01c11ec087fdf73
https://doi.org/10.1016/j.elspec.2005.01.040
https://doi.org/10.1016/j.elspec.2005.01.040
Autor:
Konstantin V. Emtsev, Anton Tadich, Lothar Ley, J.D. Riley, L. Broekman, R.C.G. Leckey, Thomas Seyller, E. Huwald
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. :1001-1004
A second generation toroidal electron spectrometer is briefly described and results presented that demonstrate its capabilities. Band structure measurements obtained from graphitised SiC (0 0 0 1) and X-ray photoelectron diffraction results from Cu (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::341724c0e2c50b9870eec173b91915c7
https://doi.org/10.1016/j.elspec.2005.01.022
https://doi.org/10.1016/j.elspec.2005.01.022
Autor:
Anton Tadich, L. Broekman, R.C.G. Leckey, J.D. Riley, Thomas Seyller, Konstantin V. Emtsev, Lothar Ley, E. Huwald
Publikováno v:
Materials Science Forum. :547-550
We have investigated Si-rich reconstructions of 4H-SiC( 00 1 1 ) surfaces by means of low-energy electron diffraction (LEED), x-ray photoelectron spectroscopy (XPS), and angleresolved ultraviolet photoelectron spectroscopy (ARUPS). The reconstruction
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8d9594fc18a4cdea72b3ba980059533
https://doi.org/10.4028/www.scientific.net/msf.483-485.547
https://doi.org/10.4028/www.scientific.net/msf.483-485.547
Autor:
Kun Yuan Gao, Thomas Seyller, R.C.G. Leckey, Lothar Ley, Gerhard Pensl, Florin Ciobanu, Anton Tadich, J.D. Riley
Publikováno v:
Materials Science Forum. :1369-1372
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33a779fb2f1420ee3ff3ada3f8ac2472
https://doi.org/10.4028/www.scientific.net/msf.457-460.1369
https://doi.org/10.4028/www.scientific.net/msf.457-460.1369
Autor:
Anton Tadich, J.D. Riley, Konstantin V. Emtsev, D. James, R.C.G. Leckey, N. Sieber, Ralf Graupner, Lothar Ley, Martin Polcik, Thomas Seyller
Publikováno v:
Materials Science Forum. :395-398
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d975a69f7a907f7a9c0376dd1aca997c
https://doi.org/10.4028/www.scientific.net/msf.457-460.395
https://doi.org/10.4028/www.scientific.net/msf.457-460.395
Publikováno v:
Physica Scripta. 69:69-73
The treatment of GaAs (001) surface with different thicknesses of Mg layers has been studied. When Mg is deposited onto GaAs, the Mg immediately penetrates the top layers of the GaAs where interaction occurs between Mg and GaAs to form an impurity pa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8db18fd93b722c81efd2eb8c63089c80
https://doi.org/10.1238/physica.regular.069a00069
https://doi.org/10.1238/physica.regular.069a00069
Publikováno v:
Surface Review and Letters. 10:669-675
ZnSe epilayers have been grown under various Se/Zn atomic flux ratios in the range of 0.22–2.45 at a substrate temperature of 350°C on Zn pre-exposed GaAs (111) A surfaces. Real time reflection high energy electron diffraction (RHEED) observations
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53efa1f649f8a123597f84fe6c62242a
https://doi.org/10.1142/s0218625x03005384
https://doi.org/10.1142/s0218625x03005384
Publikováno v:
Materials Science Forum. :713-716
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11c2985c737591f0fcf9979dcd6b7df2
https://doi.org/10.4028/www.scientific.net/msf.389-393.713
https://doi.org/10.4028/www.scientific.net/msf.389-393.713