Zobrazeno 1 - 10
of 74
pro vyhledávání: '"R.A. Schwarzer"'
Autor:
R.A. Schwarzer
Publikováno v:
Microscopy Today. 16:34-37
Automated Crystal Orientation Microscopy (ACOM) on a grain specific level has proved to be an invaluable new tool for characterizing polycrystalline materials. It is usually based on scanning facilities using electron diffraction , due to its high se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c652b71d5aa3388eb1564bc2ae5bc4dd
https://doi.org/10.1017/s1551929500054316
https://doi.org/10.1017/s1551929500054316
Autor:
R.A. Schwarzer
Publikováno v:
Microscopy Today. 15:40-43
Backscatter Kikuchi Diffraction (BKD) from crystalline solids has been known since 1928. But only during the last decade, when sufficiently sensitive cameras, fast PCs and high-performance SEMs have been available, has this technique been developed i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::085e9cb3876c786ec852de251625acc7
https://doi.org/10.1017/s1551929500051026
https://doi.org/10.1017/s1551929500051026
Autor:
A.K. Singh, R.A. Schwarzer
Publikováno v:
Materials Science and Engineering: A. 307:151-157
This work describes the evolution of texture during cold rolling of the titanium alloys Ti–0.4Mn and Ti–1.8Mn. The development of the cold rolling textures has been examined from 5 to 75% reduction. In order to compare the effect of different def
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be6dc0a1f1393ee4bacc1b5ef06aab4c
https://doi.org/10.1016/s0921-5093(00)01965-1
https://doi.org/10.1016/s0921-5093(00)01965-1
Autor:
A.K Singh, R.A Schwarzer
Publikováno v:
Scripta Materialia. 44:375-380
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4c822d32df3dfd2f13f8476c4c04e4e
https://doi.org/10.1016/s1359-6462(00)00592-3
https://doi.org/10.1016/s1359-6462(00)00592-3
Autor:
R.A. Schwarzer
Publikováno v:
Materials Science and Technology. 16:1384-1388
Automated crystal orientation mapping (ACOM) with digital beam scan in the SEM enables crystal orientation mapping and quantitative texture analysis on large specimen areas of half a square centimetre wide or more, without sacrificing accuracy of ori
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71295a6400d0b8bfd06bdb40243bea78
https://doi.org/10.1179/026708300101507325
https://doi.org/10.1179/026708300101507325
Publikováno v:
Materials Science and Technology. 16:1389-1392
Automated crystal orientation measurement/mapping (ACOM) in the SEM enables a fast phase discrimination and the automated acquisition of phase distribution maps at submicrometre resolution, if the phases belong to different Laue groups or if their la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0b7178708e84bb07b38e7a7a2769bf8
https://doi.org/10.1179/026708300101507334
https://doi.org/10.1179/026708300101507334
Autor:
R.A. Schwarzer, A. Huot
Publikováno v:
Crystal Research and Technology. 35:851-862
The benefits of analytical electron microscopy are the correlation of morphology, elemental composition and crystal structure on a submicron scale. Automated crystal orientation measurement (ACOM) in the SEM enables, by digital beam scan, the conveni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a18d6b0508005e04186ce2aab1c4b48
https://doi.org/10.1002/1521-4079(200007)35:6/7<851::aid-crat851>3.0.co
https://doi.org/10.1002/1521-4079(200007)35:6/7<851::aid-crat851>3.0.co
Publikováno v:
Physica C: Superconductivity. 312:7-20
We have investigated the oxygen diffusion behavior by means of electric resistivity measurements on epitaxial, c -axis-oriented YBa 2 Cu 3 O 7− δ thin films in the temperature regime up to 800 K. A pronounced transient local resistivity maximum (T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c6a91f11a9ffec20f2e579bc6eb9963
https://doi.org/10.1016/s0921-4534(98)00676-5
https://doi.org/10.1016/s0921-4534(98)00676-5
Publikováno v:
Advances in X-ray Analysis. 38:547-550
For a complete description of a material's microstructure the morphology as well as the distributions of chemical elements and of crystal lattice orientations must be known. While morphology is a standard issue of electron microscopy, and element dis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af2d2bc091dccc55f4d35e30f8a4d4fe
https://doi.org/10.1154/s0376030800018218
https://doi.org/10.1154/s0376030800018218
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Today’s Electron Backscatter Diffraction (EBSD) systems are based on online pattern acquisition and indexing. The new-developed fast, high-sensitivity CCD camera used in the new EBSD detector has now surpassed the speed of available indexing softwa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b3126bb2d1912acaf7717ab4917ce3d
https://doi.org/10.1007/978-3-540-85156-1_312
https://doi.org/10.1007/978-3-540-85156-1_312
