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Spectral Map Analysis of Microarray Data

Autor: Willem Talloen, R. Verbeeck, Luc Bijnens, R.A. Ion, L. Wouters, P.J. Lewi, Hinrich W. H. Göhlmann

Specific aspects of analyzing microarray data are described, which include size and shape of gene expression profiles, taking logarithms, and the biplot graphic for visualizing associations between genes and cells. Three methods of factor analysis ar

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fc16f50d0db2c2998e856a8f1b5a521
https://doi.org/10.1016/b978-044452701-1.00009-0

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Bayesian model for early reliability prediction

Autor: R.A. Ion, D.M. Karydas, I. Nitescu, H. Kalishoek

Publikováno v: RAMS '06. Annual Reliability and Maintainability Symposium, 2006..

This paper provides a Bayesian model for estimating the failure probability in the field, early after a product has been introduced to the market. First, the need for early reliability is recognized. Next, the Bayesian method is briefly explained aft

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ba7becaa59f4fc2367d142996ca43329
https://doi.org/10.1109/rams.2006.1677384

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Reliability prediction for complex medical systems

Autor: R.A. Ion, T. Wensing, P.J.M. Sonnemans

Publikováno v: Proceedings of the Annual Reliability and Maintainability Symposium RAMS, 368-373
STARTPAGE=368;ENDPAGE=373;TITLE=Proceedings of the Annual Reliability and Maintainability Symposium RAMS

In innovative fast product development processes is it necessary to determine as fast as possible whether the product reliability is at the right level. This paper describes analyses of field data for several apparently similar systems during the war

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b618cf7ba1f1fad9db764af642c9ac8
https://research.tue.nl/nl/publications/76595e8d-3337-4665-8695-5c856c5a008c

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Early reliability prediction in consumer electronics using Weibull distribution functions

Autor: Peter C. Sander, R.A. Ion

Publikováno v: Proceedings of the Annual Reliability and Maintainability Symposium, 43-47
STARTPAGE=43;ENDPAGE=47;TITLE=Proceedings of the Annual Reliability and Maintainability Symposium

This paper discusses the estimation of the failure probability during the warranty period. The failure probability is assumed to follow a Weibull distribution function. A case study based on example data based on the maximum likelihood estimation, is

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efc18e5e5e435d8e2e0e5838c731623d
https://doi.org/10.1109/RAMS.2005.1408336

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Using dynamic reliability models to extend the economic life of strongly innovative products

Autor: D. Shangguan, R.A. Ion, Aarnout Brombacher, J.A. van den Bogaard, G. Hulsken, J.S.R. Jayaram

Publikováno v: Proceedings of the 2004 IEEE International Symposium on Electronics & the Environment, 220-225
STARTPAGE=220;ENDPAGE=225;TITLE=Proceedings of the 2004 IEEE International Symposium on Electronics & the Environment

This paper presents a concept that enables the modeling of the lifetime of products by using degradation analysis. With this model, the reliability characteristics of products can be predicted and the design of the products can be optimized for robus

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b2fefe35deee31cc8fd5314c893979d1
https://doi.org/10.1109/isee.2004.1299719

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