Zobrazeno 1 - 10
of 17
pro vyhledávání: '"R. Vanden Berghe"'
Publikováno v:
Microelectronics International. 13:5-8
Thick film screen printing technology is able to reach a pitch of 250 μm. In an attempt to achieve lower values, two approaches have been developed so far. Both are based on the combination of screen printing as a deposition technique and photolitho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f86f9e6faf1472773ef1e897e8e2ac4c
https://doi.org/10.1108/13565369610800322
https://doi.org/10.1108/13565369610800322
Autor:
R. Vanden Berghe, B. Willems
Publikováno v:
Microelectronics International. 9:52-60
The solderability of a material is considered as the ability of the surface to be wetted by solder, and the rate at which this process occurs. The solderability of thick film conductors based on palladium—silver, by Pb/Sn/Ag solder, was evaluated u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f04f360223f8c66ed2ac49cd6e4661e9
https://doi.org/10.1108/eb044480
https://doi.org/10.1108/eb044480
Publikováno v:
Microelectronics International. 8:16-20
The reliability of thick film multilayer systems, based on palladium‐silver conductors, and obtained from several suppliers, is evaluated. A test structure is presented and the impact of different parameters, such as humidity, temperature, voltage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfde07f63f91d1a89b3caf03d3e6611d
https://doi.org/10.1108/eb044444
https://doi.org/10.1108/eb044444
Publikováno v:
Microelectronics International. 7:5-13
A new method of studying the accelerated ageing of interconnection materials is applied to a high‐stability thick film resistor system (the Du Pont HS‐80 system). The new method, referred to hereafter as the in‐situ method, allows measurement o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d0bd581f44d06d01f1ee1b440d8412c
https://doi.org/10.1108/eb044420
https://doi.org/10.1108/eb044420
Autor:
D. Vanicky, A. Van Calster, R. Vanden Berghe, W. Delbare, S. Demolder, Koenraad Allaert, M. Vrana
Publikováno v:
Microelectronics International. 12:16-18
The evolution of today's high speed electronic systems has resulted in the need for modules which are able to provide all chip‐to‐chip interconnection with very fine top level and buried conductor traces, and a dielectric with a very dense via gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2be80846d8c04497a4177f084c877ea5
https://doi.org/10.1108/eb044550
https://doi.org/10.1108/eb044550
Publikováno v:
Surface and Interface Analysis. 7:79-87
Silicon nitride films are currently investigated by AES combined with ion profiling techniques for their stoichiometry and oxygen content. During this analysis, ion beam and primary electron effects were observed. The effect of argon ion bombardment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73df14f3bcaa5fc374f13e408df2d326
https://doi.org/10.1002/sia.740070205
https://doi.org/10.1002/sia.740070205
Publikováno v:
Journal of General Virology. 34:353-361
In vitro cultured mouse peritoneal macrophages are inefficient host cells for both alpha and flaviruses tested. Production of infectious virus ceased 6 to 24 h after infection, except for virulent and avirulent SF strains. This limited growth is unre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae2bfabb2ce9770707bb6ada2f21f30a
https://doi.org/10.1099/0022-1317-34-2-353
https://doi.org/10.1099/0022-1317-34-2-353
Publikováno v:
Surface and Interface Analysis. 8:205-217
Le dispositif experimental consiste en une lame d'or en contact avec une lame de fer ou de nickel, le tout etant scelle sous azote dans un tube de verre. La diffusion est obtenue par recuit dans differentes atmospheres: vide, azote, azote et oxygene.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f63eab348566343d60c9ce3466812f1c
https://doi.org/10.1002/sia.740080504
https://doi.org/10.1002/sia.740080504
Autor:
R. Vanden Berghe, R. Vlaeminck
Publikováno v:
Surface and Interface Analysis. 10:316-318
The N KLL peak in the electron-stimulated Auger spectrum of some (transition metal) nitrides is shown. A tentative explanation for the observations is presented, referring to literature data.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fe0cb56b9357e091a73312795632988
https://doi.org/10.1002/sia.740100609
https://doi.org/10.1002/sia.740100609
Publikováno v:
Surface and Interface Analysis. 9:330-330
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a46006092f80c7be67fe8aa8171b35d3
https://doi.org/10.1002/sia.740090514
https://doi.org/10.1002/sia.740090514