Zobrazeno 1 - 10
of 111
pro vyhledávání: '"R. Rajsuman"'
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 54:1678-1698
To test next-generation system-on-a-chip (SoC) ICs, an open architecture automatic test equipment (ATE) has been conceived. Open architecture provides a framework to integrate software and instruments of different vendors into the ATE. The specificat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd12b61973896c2d685de321d29605da
https://doi.org/10.1109/tim.2005.856714
https://doi.org/10.1109/tim.2005.856714
Autor:
R. Rajsuman
Publikováno v:
IEEE Design & Test of Computers. 18:16-27
Large on-chip memories are desirable but difficult to implement. Challenges range from design automation to fabrication to test algorithms and memory redundancy and repair.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed35ae616beaa9162480ebb7a8239fba
https://doi.org/10.1109/54.922800
https://doi.org/10.1109/54.922800
Autor:
R. Rajsuman
Publikováno v:
Proceedings of the IEEE. 88:544-568
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82fd3f1f1c62d14682d3a51533d20313
https://doi.org/10.1109/5.843000
https://doi.org/10.1109/5.843000
Autor:
R. Rajsuman, S.R. Das
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 55:378-380
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc1ae7d17b93a08bee774ac3c13b7f1b
https://doi.org/10.1109/tim.2006.873383
https://doi.org/10.1109/tim.2006.873383
Autor:
T.L. Anderson, Yervant Zorian, R. Rajsuman, R. Walther, C. Mallipeddi, Rajarathnam Chandramouli, Sujit Dey, S. Hemmady
Publikováno v:
IEEE Design & Test of Computers. 14:81-89
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c73a4faad8ffc91e15e79c50cc25120
https://doi.org/10.1109/mdt.1997.587747
https://doi.org/10.1109/mdt.1997.587747
Autor:
R. Rajsuman, S. Hwang
Publikováno v:
VLSI Design. 5:299-311
In this paper, we examine the effectiveness of combined logic and IDDQ testing to detect stuck-at and bridging faults. The stuck-at faults are detected by the logic test and IDDQ testing detects bridging faults.Near minimal stuck-at test sets are use
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::835856917c6dc9f41cdc35db077a09f6
https://doi.org/10.1155/1997/59329
https://doi.org/10.1155/1997/59329
Autor:
S.R. Das, R. Rajsuman
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 54:1659-1661
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e9224fda9d4b04370789cb71c3fc236
https://doi.org/10.1109/tim.2005.857481
https://doi.org/10.1109/tim.2005.857481
Publikováno v:
IEEE Journal of Solid-State Circuits. 30:855-863
Single BJT BiCMOS devices exhibit sequential behavior under transistor stuck-OPEN (s-OPEN) faults. In addition to the sequential behavior, delay faults are also present. Detection of s-OPEN faults exhibiting sequential behavior needs two-pattern or m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28c61e7e6a02943afcbf28b506ffcc56
https://doi.org/10.1109/4.400427
https://doi.org/10.1109/4.400427
Autor:
R. Rajsuman, Sunil R. Das
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 52:1350-1352
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d9cbb9d859bac57efabcef675792c0a
https://doi.org/10.1109/tim.2003.819774
https://doi.org/10.1109/tim.2003.819774
Autor:
R. Rajsuman
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 13:935-939
A testing method for EEPLA's is presented. The method requires small amount of extra hardware and provides complete fault coverage. This method exploits the fact that each crosspoint can be reprogrammed in EEPLA. To our knowledge, this is the first a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed873e2190b001cc599d36867d55686c
https://doi.org/10.1109/43.293950
https://doi.org/10.1109/43.293950