Zobrazeno 1 - 10
of 14
pro vyhledávání: '"R. R. Cerchiara"'
Publikováno v:
SSRN Electronic Journal.
In this paper we recall and comment, aiming to help understanding, the model assumptions underlying the undertaking specific parameter (USP) method 1 as defined in the Solvency II regulation. In addition we propose an adjusted standard deviation esti
Autor:
Arda Genc, Paul E. Fischione, J. M. Matesa, Hamish L. Fraser, R. R. Cerchiara, J Liu, A. C. Robins
Publikováno v:
Microscopy Today. 19:16-19
With the recent advances made in monochromation of electron sources and Cs-correction, the point resolution of the transmission electron microscope (TEM) has been extended into the sub-Angstrom regime. This development has led to an important consequ
Publikováno v:
Microscopy and Microanalysis. 20:2108-2109
Autor:
Anjana Asthana, M. F. Boccabella, R. R. Cerchiara, Paul E. Fischione, N. S. Fishman, L. M. Marsh, A. C. Robins
Publikováno v:
Microscopy and Microanalysis. 20:1724-1725
Publikováno v:
International Symposium for Testing and Failure Analysis.
A packaged device based on a ball grid array or other design presents a challenge to the failure analyst. Accessing one of the metal levels from the topside requires decapsulation by either a wet, predominantly dry (RIE) or a completely dry (mechanic
Autor:
H. A. Cook, J. J. Gronsky, Joseph M. Matesa, A. C. Robins, R. R. Cerchiara, E. Beach, Paul E. Fischione, Steven J. Rozeveld, J. Waeterloos, David W. Smith, Charlie Wood
Publikováno v:
International Symposium for Testing and Failure Analysis.
The SiLK resins, composed of aromatic hydrocarbons, are a family of highly cross-linked thermoset polymers with isotropic dielectric properties. Patterning of SiLK for high aspect ratio copper interconnects has depended on reactive ion etching with o
Autor:
Paul E. Fischione, R. R. Cerchiara, Steven J. Rozeveld, Charlie Wood, Joseph M. Matesa, David W. Smith, A. C. Robins, E. Beach, J. J. Gronsky, Joost Waeterloos
Publikováno v:
Microscopy and Microanalysis. 11
Publikováno v:
Microscopy and Microanalysis. 17:632-633
Since its introduction as a complement to the Focused Ion Beam (FIB) in 2004, an increasing number of applications have been developed for use of a concentrated Ar ion beam with a diameter on the order of 1 μm. [1 – 11] The material systems that h
Autor:
J Lange, A. C. Robins, P Woods, Joseph M. Matesa, Paul E. Fischione, M. F. Boccabella, R. R. Cerchiara
Publikováno v:
Microscopy and Microanalysis. 17:390-391
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Publikováno v:
Microscopy and Microanalysis. 16:684-685
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.