Zobrazeno 1 - 10
of 21
pro vyhledávání: '"R. Ploessl"'
Autor:
E. Ahmad, R. Ploessl, R. J. Hicken, C. Daboo, E. Gu, J. A. C. Bland, D. E. P. Eley, J. N. Chapman, S. J. Gray, M. Gester
Publikováno v:
Physical Review B. 51:15964-15973
We have undertaken a detailed study of the macroscopic and microscopic magnetization reversal processes in epitaxial ferromagnetic thin films with varying cubic and uniaxial magnetocrystalline anisotropy strengths. The macroscopic magnetization rever
Publikováno v:
Journal of Applied Physics. 74:7431-7437
An analysis of the micromagnetic structure of domains and domain walls in Co/Pt multilayer films is reported. Magneto‐optically written domains have been imaged in a scanning transmission electron microscope by using the modified differential phase
Publikováno v:
Journal of Applied Physics. 74:7438-7442
An analysis is presented of the detailed effects of varying the write parameters in Co/Pt multilayer films. Domains written thermomagnetically by laser modulation have been imaged using the modified differential phase contrast mode of Lorentz electro
Publikováno v:
Journal of Applied Physics. 73:2447-2452
The modified differential phase contrast (MDPC) mode of Lorentz electron microscopy was used to study the micromagnetic structure of cross‐tie walls in permalloy. The distribution of magnetic induction along these walls is characterized and studied
Publikováno v:
Ultramicroscopy. 47:331-338
A detailed knowledge of the physical and magnetic microstructure is important if the properties of modern magnetic materials are to be understood and subsequently improved. Imaging techniques available using a STEM equipped with a segmented detector
Publikováno v:
Journal of Applied Physics. 76:6440-6442
The magnetic domain structure and microscopic magnetization reversal processes in epitaxial Fe/GaAs(001) films with cubic anisotropy and in‐plane easy axes have been investigated by a Lorentz microscope equipped with a magnetizing stage. For the fi
Autor:
Stefan J. Weber, L. Yang, G.Z. Lu, R.F. Schnabel, D. Tobben, Chenting Lin, J. L. Hurd, Sunny Chiang, R. Filippi, J. Ning, Kenneth P. Rodbell, T. Gou, R. Longo, M. Ronay, Roderick C. Mosely, L. Gignac, Mark Hoinkis, R. Ploessl, S. Voss, Clevenger Leigh Anne H, Jeffrey P. Gambino, Lian-Yuh Chen, G. Costrini, D.M. Dobuzinsky, J.F. Nuetzel, R. C. Iggulden
Publikováno v:
Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102).
As VLSI back end of line (BEOL) wiring is scaled to 0.175 /spl mu/m dimensions and sub-0.5 /spl mu/m pitches, the challenges to conventional Al RIE BEOL processes are the etching and the reliability of tall/narrow Al lines and the oxide gap fill and
Publikováno v:
Physical review. B, Condensed matter. 51(6)
Autor:
R. J. Hicken, S. J. Gray, M. Gester, J. N. Chapman, E. Gu, J. A. C. Bland, R. Ploessl, C. Daboo
Publikováno v:
Journal of Magnetism and Magnetic Materials. 148:262-263
We present the results of a systematic study of the evolution of magnetic anisotropies of epitaxial Fe films grown on GaAs (001) and (110) substrates and also on epitaxial Ag buffer layers. The anisotropy was studied in-situ with the magneto-optic Ke
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