Zobrazeno 1 - 10
of 115
pro vyhledávání: '"R. Pickenhain"'
Autor:
Sebastian Geburt, R. Pickenhain, Carsten Ronning, Marius Grundmann, Holger von Wenckstern, Stefan Müller, Florian Schmidt
Publikováno v:
physica status solidi (b). 251:937-941
Pulsed-laser deposited ZnO thin films were implanted with Ar-ions to generate intrinsic defects within the material. The defects created were analyzed by deep-level and optical deep-level transient spectroscopy. Deep-level defects with thermal activa
Publikováno v:
Solid-State Electronics. 92:40-46
We present an overview of implementation and application of low rate Deep-Level Transient Spectroscopy (LR-DLTS). In conventional DLTS the sensitivity of the capacitance meter must be chosen so low that the whole capacitance drift range between lowes
Publikováno v:
Solid-State Electronics. 75:48-54
Electronic defect states in a n -type conducting zinc oxide thin film sample were investigated by means of space charge spectroscopy focussing on levels in the midgap region as well as on hole traps. To overcome the experimental difficulties arising
Autor:
Marius Grundmann, Wolfgang Skorupa, Gerhard Brauer, Florian Schmidt, Kerstin Brachwitz, Martin Ellguth, Matthias Schmidt, R. Pickenhain, Holger von Wenckstern
Publikováno v:
physica status solidi (b). 248:1949-1955
Electronic defects in nickel-doped zinc oxide thin films have been investigated by means of capacitance spectroscopy. The samples were grown by pulsed laser deposition on a-plane sapphire substrates. Nickel was introduced into the films (a) during gr
Publikováno v:
physica status solidi (b). 248:941-949
We have applied a special variant of optical DLTS to deep levels found in ZnO thin films. The optical emission rates of charge carriers from deep levels into a band have been measured over a range of photon energies from 0.7 to 3.0 eV and photoioniza
Autor:
Thomas Lüder, Matthias Schmidt, R. Pickenhain, Wolfgang Skorupa, Marius Grundmann, Holger von Wenckstern, Florian Schmidt, Martin Ellguth, Gerhard Brauer
Publikováno v:
physica status solidi (b). 247:1220-1226
Defects in a nitrogen implanted and thermally annealed zinc oxide thin film (n-type conducting) and reference samples were studied. Space charge regions realised by fabrication of semitransparent palladium Schottky contacts enabled the application of
Autor:
Marius Grundmann, Holger von Wenckstern, R. Pickenhain, Gabriele Benndorf, Andreas Pöppl, Matthias Schmidt, Rolf Böttcher
Publikováno v:
physica status solidi (b). 255:1700670
Autor:
Heidemarie Schmidt, Karl Jug, Bruno K. Meyer, Viatcheslav A. Tikhomirov, Hilkka Saal, A. Börger, Klaus-Dieter Becker, Matthias Brandt, Alexander Lajn, Angelika Polity, Michael Lorenz, Michael Binnewies, Detlev M. Hofmann, Marius Grundmann, H. von Wenckstern, R. Pickenhain
Publikováno v:
Progress in Solid State Chemistry 37(2009), 153-172
In this contribution we review the impact of anionic and cationic substitutions on the electronic properties of bulk ZnO crystals, thin films and ZnO powders. p-type doping is discussed with focus on the anionic substitution of oxygen by nitrogen or
Autor:
Marius Grundmann, R. Pickenhain, Heidemarie Schmidt, G. Biehne, Michael Lorenz, Matthias Brandt, G. Brauer, H. von Wenckstern
Publikováno v:
Superlattices and Microstructures 42(2007), 14-20
We have realized a p-type ZnO surface layer by N + ion implantation of a high quality ZnO wafer and subsequent annealing. The conduction type of this surface layer was revealed by scanning capacitance microscopy. Rectifying current–voltage characte