Zobrazeno 1 - 6
of 6
pro vyhledávání: '"R. N. Leyden"'
Autor:
D. I. Basiulis, R. N. Leyden
Publikováno v:
MRS Proceedings. 110
A study was made of the adhesion of insulating polymer coatings under long term exposure to electrical bias. Since a common mode of failure in implanted devices is the penetration of water into poorly adhering insulation/conductor interfaces followed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24cf29d711e2c39678973f418e97e814
https://doi.org/10.1557/proc-110-627
https://doi.org/10.1557/proc-110-627
Autor:
R. N. Leyden, M. F. Hawthorne
Publikováno v:
Chemischer Informationsdienst. 6
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0429317a567d7ad2d17362b0a9f4afee
https://doi.org/10.1002/chin.197531352
https://doi.org/10.1002/chin.197531352
Publikováno v:
Chemischer Informationsdienst. 9
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57eb8991d87869cc5191f40562352e85
https://doi.org/10.1002/chin.197838285
https://doi.org/10.1002/chin.197838285
Publikováno v:
Chemischer Informationsdienst. 14
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5c7b066848cfd53779b7c0e2644da8d
https://doi.org/10.1002/chin.198331127
https://doi.org/10.1002/chin.198331127
Publikováno v:
ACS Symposium Series ISBN: 9780841216792
Polymeric Materials for Electronics Packaging and Interconnection
Polymeric Materials for Electronics Packaging and Interconnection
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11a23ec4dc1eed09bdf2548ea3a31701
https://doi.org/10.1021/bk-1989-0407.ch014
https://doi.org/10.1021/bk-1989-0407.ch014
Autor:
JOHN H. LUPINSKI, ROBERT S. MOORE, Eric D. Wachsman, Peter S. Martin, Curtis W. Frank, Randy W. Snyder, Paul C. Painter, Coralie A. Pryde, Allyson J. Beuhler, Neal R. Nowicki, Joanne M. Gaudette, A. R. Rossi, B. D. Silverman, Diane M. Stoakley, Anne K. St. Clair, D. L. Goff, E. L. Yuan, H. Long, Herbert J. Neuhaus, F. M. Houlihan, B. J. Bachman, C. W. Wilkins, C. Feger, L. M. Baker, P. J. Brown, J. L. Markham, P. P. Policastro, P. K. Hernandez, Stephen L. Buchwalter, J. McHardy, D. I. Basiulis, G. Angsten, L. R. Higley, R. N. Leyden, Stephen D. Senturia, R. D. Small, S. F. Hahn, P. H. Townsend, D. C. Burdeaux, J. A. Gilpin, James L. Hedrick, Jeff W. Labadie, C. P. Wong, Gust J. Kookootsedes, Kanji Otsuka, Hisashi Ishida, Yasuyuki Utsumi, Takashi Miwa, Yuji Shirai, Philip R. Troyk, David Conroy, James E. Anderson, Justin C. Bolger, Michael A. Lutz, Kristen A. Scheibert, D. J. Belton, E. A. Sullivan, M. J. Molter, D. A. Hoffmann, L. J. Bousse, V. Markovac, I. Kim, W. F. van den Bogert, S. A. Gee, V. R. Akylas, Rolf W. Biernath, David S. Soane, A. A. Gal