Zobrazeno 1 - 6
of 6
pro vyhledávání: '"R. M. Schoonover"'
Publikováno v:
Metrologia. 10:117-121
NBS has measured the densities of four single crystal silicon objects to a standard deviation of 0.26 ppm with a systematic error of 0.7 ppm. These objects will be used as working standards to which density work in the United States will be referred.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7535589bd804ecf60c7fd7098bdc4c1e
https://doi.org/10.1088/0026-1394/10/4/001
https://doi.org/10.1088/0026-1394/10/4/001
