Zobrazeno 1 - 2
of 2
pro vyhledávání: '"R. Le Tiec"'
Autor:
S. Levi, R. Le Tiec, C. Dupre, C. Vannuffel, T. Dewolf, S. Garcia, K. Millard, B. Meynard, Y. Lee, M. Colard, H. Al Dujaili, J. Faugier-Tovar, Shinsuke Mizuno
Publikováno v:
2022 International Symposium on Semiconductor Manufacturing (ISSM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04b44e73735c8edd6888d380933f96d9
https://doi.org/10.1109/issm55802.2022.10027161
https://doi.org/10.1109/issm55802.2022.10027161
Autor:
C. Le Royer, B. Mohamad, J. Biscarrat, L. Vauche, R. Escoffier, J. Buckley, S. Becu, R. Riat, C. Gillot, M. Charles, S. Ruel, P. Pimenta-Barros, N. Posseme, P. Besson, F. Boudaa, C. Vannuffel, W. Vandendaele, A.G. Viey, A. Krakovinsky, M.-A. Jaud, R. Modica, F. Iucolano, R. Le Tiec, S. Levi, M. Orsatelli, R. Gwoziecki, V. Sousa
Publikováno v:
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44dbbb3d01be89be8061e02121c4b306
https://doi.org/10.1109/ispsd49238.2022.9813672
https://doi.org/10.1109/ispsd49238.2022.9813672