Zobrazeno 1 - 10
of 31
pro vyhledávání: '"R. L. Strong"'
Autor:
Michael A. Kinch, R. L. Strong
Publikováno v:
Journal of Electronic Materials. 43:2824-2830
HgCdTe infrared focal plane array (FPA) operability is usually limited not by dark current defects but by noise defects. Pixels with high 1/f noise should produce a tail in the root-mean-square (RMS) noise distribution. Integration time normalization
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8583f7d504b5b7150b81c5f7f8962bad
https://doi.org/10.1007/s11664-014-3099-0
https://doi.org/10.1007/s11664-014-3099-0
Publikováno v:
SPIE Proceedings.
Reducing an array’s pixel pitch reduces the size and weight of the focal plane array (FPA) and its associated dewar, cooler and optics. Higher operating temperatures reduce cool-down time and cooler power, enabling reduced cooler size and weight. H
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95a9e905b4928c961b3b2013ee860819
https://doi.org/10.1117/12.2015816
https://doi.org/10.1117/12.2015816
Publikováno v:
Journal of Electronic Materials. 24:1293-1297
Piezoelectric effect in long-wavelength infrared (LWIR) HgCdTe has been studied using metal-insulator-semiconductor (MIS) and p-n homojunction devices. A cantilever beam technique was used to measure the shift in flatband voltage in the MIS devices a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b48465ab9f1852854df0dbaf1b6b0309
https://doi.org/10.1007/bf02653087
https://doi.org/10.1007/bf02653087
Autor:
Chang-Feng Wan, M. J. Ohlson, R. D. Burford, C. A. Schaake, D. Chandra, H. F. Schaake, R. L. Strong, Michael A. Kinch, J. Jacques, P. K. Liao
Publikováno v:
SPIE Proceedings.
The High Operating Temperature Auger suppressed infrared detector concept is being pursued using the high density vertically integrated photodiode (HDVIP ® ) architecture and an n + -p device structure. Dark current densities as low as 2.5 mA/cm 2 n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7097b5e03fe2adeeba86c7612dfd01d1
https://doi.org/10.1117/12.846254
https://doi.org/10.1117/12.846254
Autor:
Patricia B. Smith, R. L. Strong
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1544-1548
The most common techniques used for the determination of thin film thickness are profilometry, spectrophotometry, and ellipsometry. Spectrophotometers require the refractive index of the film (generally assumed to be transparent) as an input paramete
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::101ac5057091efdf31b2dc2c2060541c
https://doi.org/10.1116/1.576762
https://doi.org/10.1116/1.576762
Autor:
M. F. S. Tang, R. L. Strong, L. K. Magel, M. W. Goodwin, D. A. Stevenson, J. H. Tregilgas, S. B. Lee
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1098-1102
We report on the characterization of mercury cadmium telluride (Hg1−xCdxTe) film grown by the isothermal vapor phase epitaxial method (ISOVPE) and on the surface conversion of bulk Hg1−xCdxTe to larger bandgap material. The crystal perfection is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e70c28b14b588a76a3ae05593e845b50
https://doi.org/10.1116/1.576967
https://doi.org/10.1116/1.576967
Publikováno v:
SPIE Proceedings.
In situ monitoring provides numerous advantages in the fabrication of HgCdTe-based infrared devices. Two in situ monitoring techniques are currently being investigated in our laboratory: optical emission spectroscopy (OES) and ellipsometry. OES is id
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75a849b8babc679b2f9f296460aa7e2a
https://doi.org/10.1117/12.137778
https://doi.org/10.1117/12.137778
Autor:
C. R. Helms, C. M. Stahle, J. B. Pallix, Christopher H. Becker, R. L. Strong, A. Simmons, H. F. Schaake
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:3373-3373
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19d28975c0bfcf4f31aca2cbd56426e4
https://doi.org/10.1116/1.576560
https://doi.org/10.1116/1.576560
Autor:
James L Erskine, R. L. Strong
Publikováno v:
Physical Review B. 31:6305-6319
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e773761b65992b2b50e57a09aee72630
https://doi.org/10.1103/physrevb.31.6305
https://doi.org/10.1103/physrevb.31.6305
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:3207-3210
Anodic sulfide films were grown on HgCdTe and studied by Auger electron spectroscopy, surface analysis by laser ionization, Rutherford backscattering spectroscopy, Raman and photoluminescence spectroscopy, and high‐resolution transmission electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7fbf93f991dd38e04081be79899cf2aa
https://doi.org/10.1116/1.574839
https://doi.org/10.1116/1.574839