Zobrazeno 1 - 10
of 18
pro vyhledávání: '"R. K. Bertaska"'
Autor:
M. A. Jaspan, R. Petr, Aland K. Chin, M. T. Knapczyk, R. K. Bertaska, J. H. Jacob, S. D. Swartz, A. M. Flusberg, I. Smilanski
Publikováno v:
SPIE Proceedings.
The present model of formation and propagation of catastrophic optical-damage (COD), a random failure-mode in laser diodes, was formulated in 1974 and has remained substantially unchanged. We extend the model of COD phenomena, based on analytical stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fea75c95434e4af5623fbf9508df9a1f
https://doi.org/10.1117/12.804834
https://doi.org/10.1117/12.804834
Autor:
R. K. Bertaska, R. G. Waters
Publikováno v:
Applied Physics Letters. 52:179-181
The degradation rates for continuously operated quantum well lasers with natural facets have been investigated. For most devices, a simple functional relationship exists between degradation rate and operating current density and the data suggest that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64f8db3900616cee2b42dea75385fe38
https://doi.org/10.1063/1.99512
https://doi.org/10.1063/1.99512
Publikováno v:
Topical Meeting on Semiconductor Lasers.
Semiconductor quantum well lasers have attracted much interest of late due to their unique properties1−3 and early reliability results have been encouraging.4−6 We present life-test data on broad-area, oxide-defined graded-index quantum well (GRI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee0feae39f0c96fbac7cf22cf07827d7
https://doi.org/10.1364/sla.1987.wb9
https://doi.org/10.1364/sla.1987.wb9
Autor:
Chin, Aland K., Bertaska, Rick K.
Publikováno v:
Materials & Reliability Handbook for Semiconductor Optical & Electron Devices; 2013, p123-145, 23p
Publikováno v:
Semiconductors. May99, Vol. 33 Issue 5, p590. 4p.
Autor:
Chin, Aland K., Bertaska, Rick K., Jaspan, Martin A., Flusberg, Allen M., Swartz, Steve D., Knapczyk, Maciej T., Smilanski, Israel, Jacob, Jonah H.
Publikováno v:
MRS Online Proceedings Library; 2009, Vol. 1195 Issue 1, p40-51, 12p
Publikováno v:
Laser & Photonics Reviews; May2011, Vol. 5 Issue 3, p422-441, 20p
Autor:
Hwang, D.M., DeChiaro, L., Wang, M.C., Lin, P.S.D., Zah, C.E., Ovadia, S., Lee, T.P., Darby, D., Tkachenko, Y.A., Hwang, J.C.M.
Publikováno v:
Proceedings of 1994 IEEE International Reliability Physics Symposium; 1994, p470-477, 8p
Autor:
Herrick, Robert W., Petroff, Pierre M.
Publikováno v:
IEEE Journal of Quantum Electronics; Oct98, Vol. 34 Issue 10, p1963, 7p
Autor:
Wagner, D.K., Waters, R.G., Tihanyi, P.L., Hill, D.S., Roza, A.J., Vollmer, H.J., Leopold, M.M.
Publikováno v:
IEEE Journal of Quantum Electronics; 1988, Vol. 24 Issue 7, p1258-1265, 8p