Zobrazeno 1 - 10
of 23
pro vyhledávání: '"R. Jawalekar"'
Autor:
A.K. Chandra, Barry K. Rosen, M. Mullen, Daniel Geist, J. Yoon, I. Nair, Vijay S. Iyengar, R. Armoni, Yaron Wolfsthal, D. Jameson, R. Jawalekar
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 3:188-200
This paper describes a system (AVPGEN) for generating tests (called architecture verification programs or AVP's) to check the conformance of processor designs to the specified architecture. To generate effective tests, AVPGEN uses novel concepts like
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6af2daaa4cc478a4b413c31dd8d1591b
https://doi.org/10.1109/92.386220
https://doi.org/10.1109/92.386220
Publikováno v:
ChemInform. 21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a6a2c78b390edeb2f1de6c9f1622a9d
https://doi.org/10.1002/chin.199001018
https://doi.org/10.1002/chin.199001018
Akademický článek
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Autor:
S. R. Jawalekar, P. K. Reddy
Publikováno v:
Physica Status Solidi (a). 54:K63-K66
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65a6dbf29c3b301be8b58e0e3c219201
https://doi.org/10.1002/pssa.2210540170
https://doi.org/10.1002/pssa.2210540170
Publikováno v:
physica status solidi (a). 96:K191-K194
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c27a368f316a721a79b433199ff702f
https://doi.org/10.1002/pssa.2210960258
https://doi.org/10.1002/pssa.2210960258
Publikováno v:
International Journal of Electronics. 44:41-48
Thin-film hybrid circuits are of prime interest due to their improved temperature stability and reduced parasitics. Sputtered tantalum films and vacuum-evaporatod aluminium films are used to fabricate thin-film resistors and capacitors on passive sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a6f710ac3685dab3c6b7f7ef1a0352d
https://doi.org/10.1080/00207217808900782
https://doi.org/10.1080/00207217808900782
Autor:
M. K. Rao, S. R. Jawalekar
Publikováno v:
International Journal of Electronics. 46:483-485
Evaporated semiconductor films are used in many applications. Physical properties of such films are dependent on the deposition conditions. The present article describes the influence of the source and substrate temperature on the photoresistance of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e890f37d9946aef77d1db93c64aa5202
https://doi.org/10.1080/00207217908901031
https://doi.org/10.1080/00207217908901031
Autor:
S. R. Jawalekar, M. K. Rao
Publikováno v:
Physica Status Solidi (a). 41:K31-K33
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e62fb4affc08e775f9c946b6e36f881a
https://doi.org/10.1002/pssa.2210410152
https://doi.org/10.1002/pssa.2210410152
Autor:
S. R. Jawalekar, M. K. Rao
Publikováno v:
Physica Status Solidi (a). 38:K93-K95
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a6e4bbd4b38327d9f4886ab05f1af1c
https://doi.org/10.1002/pssa.2210380170
https://doi.org/10.1002/pssa.2210380170
Publikováno v:
IETE Journal of Research. 22:739-741
In this paper, Thin-Film Field Effect Transistor (TFT) made in our laboratory using vacuum evaporation and photolithography is reported. The different parameters are calculated. When two gates cover the same source and drain electrodes, the device wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a810b1435e9e6c11d00543c387d2c6f5
https://doi.org/10.1080/03772063.1976.11451185
https://doi.org/10.1080/03772063.1976.11451185