Zobrazeno 1 - 10
of 12
pro vyhledávání: '"R. I. Alekberov"'
Autor:
R. I. Alekberov
Publikováno v:
Управленческое консультирование, Vol 0, Iss 6, Pp 152-157 (2020)
The article is devoted to the study of the problems of local self-government in Russia in the late XIX — early XX centuries. The article analyzes the views of the Russian monarchist L. A. Tikhomirov through the prism of the main conservative moveme
Externí odkaz:
https://doaj.org/article/dae87f7f31a5453b94a1cb762eab6338
Publikováno v:
Semiconductors. 56:175-179
Publikováno v:
Molecular Crystals and Liquid Crystals. 717:24-31
The structure of amorphous As33.3Se33.3S33.4, As33.3Se33.3Te33.4 chalcogenide glasses have been studied by X-ray diffraction and Raman scattering methods. The results are explained by the Elliott’s...
Publikováno v:
Semiconductors. 54:1241-1246
The structure and optical properties of a chalcogenide glassy As–Ge–Te semiconductor film are studied by X-ray diffraction analysis, Raman spectroscopy, and optical transmission and density measurement. The main structural elements and chemical b
Publikováno v:
Glass Physics and Chemistry. 46:41-48
Using the methods of X-ray diffraction and density measurement (in the short- and middle-order scale), the influence of the chemical composition on the parameters of the local structure and the physical properties of chalcogenide glassy semiconductor
Publikováno v:
Semiconductors. 53:1500-1506
The types of structural elements and chemical bonds forming an amorphous matrix of chalcogenide glassy semiconductors of the As–Ge–Se system and changes occurring in them depending on the chemical composition are determined using a method for stu
Publikováno v:
Physica B: Condensed Matter. 550:367-375
The partial, total and average coordination number of atoms and, their neighbor distributions have been determined by the neutron diffraction method and application of the Reverse Monte Carlo modeling for experimental data in As40Se60, As40Se30S30 an
Publikováno v:
Journal of Non-Crystalline Solids. 470:152-159
The local structures of amorphous As40Se60, As40Se30S30, As33.3Se33.3S33.4 chalcogenide glass semiconductors have been studied by neutron diffraction and Raman scattering methods. The neutron diffraction data-sets were modeled by Reverse Monte Carlo
Publikováno v:
Glass Physics and Chemistry. 40:549-552
The structure of chalcogenide vitreous semiconductors (CVSs) As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction p
Publikováno v:
Semiconductors. 48:800-803
Chalcogenide vitreous semiconductors of As-Se-S and As-Se-Te compositions are synthesized, with thin films produced by thermal evaporation in vacuum. X-ray phase analysis and Raman spectroscopy are used to confirm their amorphous state and examine th