Zobrazeno 1 - 10
of 123
pro vyhledávání: '"R. Harboe-Sorensen"'
Publikováno v:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddd6da223c4d4bbaf340018021906f73
https://doi.org/10.1109/redw56037.2022.9921736
https://doi.org/10.1109/redw56037.2022.9921736
Publikováno v:
IEEE Transactions on Nuclear Science. 50:2322-2327
For space applications, can cost-effective and reliable heavy ion single-event effect (SEE) testing still be carried out on commercially available, plastic packaged, high-density memories? Their complexity, architecture, and packaging assemblies as w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72d379b8c4936fd3176ad19e0566cc80
https://doi.org/10.1109/tns.2003.821402
https://doi.org/10.1109/tns.2003.821402
Autor:
K. Gruermann, Fritz Gliem, P. Mathijs, D. Walter, R. Harboe Sorensen, H. Schmidt, K. Puimege, Christian Poivey, D. Gerrits, A. Keating, M. D'Alessio, N. Fleurinck
Publikováno v:
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::368ef330c10cc463da1e94ee6e6cce96
https://doi.org/10.1109/radecs.2013.6937432
https://doi.org/10.1109/radecs.2013.6937432
Publikováno v:
IEEE Transactions on Nuclear Science. 43:2767-2771
Unit level proton irradiation as a tool to debug low cost space experiment design and component selection has been shown to give excellent agreement with in-orbit anomalies. The procedures used and experimental results obtained are reported together
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70b5ecc78eaae30c553c0e41b31c7bcc
https://doi.org/10.1109/23.556864
https://doi.org/10.1109/23.556864
Autor:
L. Adams, C. Claeys, Jan Vanhellemont, R. Harboe-Sorensen, A. Kaniava, M.-A. Trauwaert, P. Clauws, B. Johlander, Eddy Simoen
Publikováno v:
IEEE Transactions on Nuclear Science. 41:479-486
The generation and annihilation of deep levels in diodes fabricated on nand p-type floating zone and Czochralski silicon substrates is discussed as a function of the substrate parameters and the irradiation and thermal annealing conditions. Both low
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73fde311b6ec2d80e6ca3139dae7e7ca
https://doi.org/10.1109/23.299783
https://doi.org/10.1109/23.299783
Autor:
R. Harboe-Sorensen
Publikováno v:
Radiation Physics and Chemistry. 43:165-174
The best way of assessing semiconductor susceptibility to Single Event Phenomena (SEP) would be to measure their response while operating in the actual space environment. However, this a very expensive way to characterise semiconductors and has only
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c7ff91439c11434f0989734a9ffc3ae5
https://doi.org/10.1016/0969-806x(94)90209-7
https://doi.org/10.1016/0969-806x(94)90209-7
Autor:
G. Cellere, A. Visconti, M. Murat, Alessandro Paccagnella, A. Akkerman, Ari Virtanen, M. Bonanomi, R. Harboe-Sorensen, J. Barak
Swift heavy ions impacting on matter lose energy through the creation of dense tracks of charges. The study of the space and time evolution of energy exchange allows understanding the single event effects behavior in advanced microelectronic devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76a54409cf8c8e7b29a44b717ea792a6
http://hdl.handle.net/11577/2963301
http://hdl.handle.net/11577/2963301
Autor:
Ch. Poivey, T. Beutier, R. Harboe Sorensen, Marcus H. Mendenhall, C. Binois, Daniel Peyre, G. Salvaterra, G. Montay, R. Mangeret, M. Beaumel, Robert A. Weller
Publikováno v:
2009 European Conference on Radiation and Its Effects on Components and Systems.
Proton irradiations were performed on three types of optocouplers at three energies 60 MeV, 100 MeV and 200 MeV, followed by a TID irradiation up to 75 kRAD. GEANT4 allowed the calculation of the fluences needed to induce the same NIEL. As a prelimin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd9a1d9044a7686ff02f4925d28794a3
https://doi.org/10.1109/radecs.2009.5994685
https://doi.org/10.1109/radecs.2009.5994685
Autor:
Ali Zadeh, R. Harboe Sorensen, J. Perdigues Armengol, O. Navasquillo, S. De La Rosa, J. Blasco, Christian Poivey
Publikováno v:
2009 IEEE Radiation Effects Data Workshop.
We present radiation data, Total Ionizing Dose, Displacement Damage Dose and proton induced Single Event Effects, on the DAS Photonics SIOS optical link transceiver. These tests have been performed for a radiation prescreening helping for the selecti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b4b74d7a2e7e8c4a55f498623be027c
https://doi.org/10.1109/redw.2009.5336306
https://doi.org/10.1109/redw.2009.5336306
Autor:
J. Vetter, J. Dreute, R. Harboe Sorensen, A. Noll, O. Geschke, H. Röcher, B. Wiegel, W. Heinrich, L. Adams, S.E. Hirzebruch
Publikováno v:
International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements. 19:891-894
We started a research program using heavy ion beams at the GSI Darmstadt accelerator to investigate radiation effects of heavy ions in microelectronic devices. The understanding of these radiation effects is of particular importance to estimate the r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccfebe228185b81cd900e34b19170f4d
https://doi.org/10.1016/1359-0189(91)90335-f
https://doi.org/10.1016/1359-0189(91)90335-f