Zobrazeno 1 - 4
of 4
pro vyhledávání: '"R. G. Tack"'
Publikováno v:
Journal of Applied Physics, 75(3), 1254-1257. American Institute of Physics
The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two met
Publikováno v:
Applied physics letters, 62(5), 461-463. American Institute of Physics
Operation of an alternative near-field optical microscope is presented. The microscope uses a microfabricated silicon- nitride probe with integrated cantilever, as originally developed for force microscopy. The cantilever allows routine close contact
Publikováno v:
Microscopy research and technique. 25(2)
Publikováno v:
Microscopy Research and Technique. 25:177-178