Zobrazeno 1 - 10
of 58
pro vyhledávání: '"R. G. Tack"'
Publikováno v:
Journal of Applied Physics, 75(3), 1254-1257. American Institute of Physics
The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two met
Publikováno v:
Applied physics letters, 62(5), 461-463. American Institute of Physics
Operation of an alternative near-field optical microscope is presented. The microscope uses a microfabricated silicon- nitride probe with integrated cantilever, as originally developed for force microscopy. The cantilever allows routine close contact
Publikováno v:
Microscopy research and technique. 25(2)
Publikováno v:
Journal of Natural Resources / Ziran Ziyuan Xuebao. 2020, Vol. 35 Issue 2, p472-479. 8p.
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p597-601, 5p
Autor:
Hecht, B., Bielefeldt, H.
Publikováno v:
Journal of Applied Physics; 3/15/1997, Vol. 81 Issue 6, p2492, 7p, 5 Black and White Photographs, 3 Graphs
Autor:
Fukuzawa, Kenji, Kuwano, Hiroki
Publikováno v:
Journal of Applied Physics; 11/1/1996, Vol. 80 Issue 9, p4799, 5p, 1 Diagram, 2 Graphs
Autor:
Fukuzawa, Kenji, Kuwano, Hiroki
Publikováno v:
Journal of Applied Physics; 6/1/1996, Vol. 79 Issue 11, p8174, 5p, 1 Black and White Photograph, 3 Diagrams, 2 Graphs
Publikováno v:
Journal of Applied Physics; 12/15/1995, Vol. 78 Issue 12, p7376, 6p
Publikováno v:
Journal of Applied Physics; 2/1/1994, Vol. 75 Issue 3, p1254, 4p, 2 Black and White Photographs, 2 Graphs