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pro vyhledávání: '"R. G. Arnaudov"'
Autor:
R. B. Borisov, R. G. Arnaudov
Publikováno v:
Telfor Journal, Vol 4, Iss 2, Pp 138-143 (2012)
Methodology for extracting an effective dielectric constant of microstrip transmission lines on multilayer substrates, from measured or simulated S-parameters data, using on-chip test structures, has been demonstrated. The methodology consists of: 1)
Externí odkaz:
https://doaj.org/article/ead8cdc7a30a4b05ab2ee01912e3f74f