Zobrazeno 1 - 10
of 27
pro vyhledávání: '"R. Görgl"'
Autor:
E. Brandstätter, R. Görgl
Publikováno v:
HTM Journal of Heat Treatment and Materials. 67:125-132
Kurzfassung Laserautragschweißen und Laserlegieren sind beides Technologien zur Oberlächenmodiikation von Werkzeugen und werden hauptsächlich zur lokalen Verbesserung des Widerstands gegen Verschleiß und/oder Korrosion eingesetzt. Während es sic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e56c2e4ed9c177d53d0ed9112eb19e5
https://doi.org/10.3139/105.110137
https://doi.org/10.3139/105.110137
Autor:
R.W. Ryon, P. Wobrauschek, S. Pahlke, Peter Kregsamer, Christina Streli, Piero Pianetta, L. Fabry, V. Bauer, R Görgl
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 52:861-872
Total reflection X-ray fluorescence analysis (TXRF) of light elements, such as C, O and Al (atomic numbers 5–13) generally has poor sensitivity and detection limits due to poor excitation and low fluorescent yields. Special excitation sources are n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acfb1255b38f082568210fb738cdcacf
https://doi.org/10.1016/s0584-8547(96)01663-1
https://doi.org/10.1016/s0584-8547(96)01663-1
Autor:
Peter Kregsamer, Martin Radtke, Arndt Knöchel, R. Görgl, P. Wobrauschek, S. Pahlke, L. Fabry, M. Haller, C. Streli
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 52:901-906
Total Reflection X-Ray Fluorescence Analysis excited with synchrotron radiation (SR-TXRF) monochromatized by a multilayer (ML) has been used for the analysis of Ni on Si-wafer surfaces. Intentionally contaminated wafers using droplet samples have bee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd729b25650415e38ca564610f6c5b79
https://doi.org/10.1016/s0584-8547(96)01674-6
https://doi.org/10.1016/s0584-8547(96)01674-6
Autor:
Peter Kregsamer, R. Görgl, Martin Radtke, M. Haller, C. Streli, Arndt Knöchel, P. Wobrauschek
Publikováno v:
X-Ray Spectrometry. 26:189-194
The use of synchrotron radiation as the excitation source for total reflection x-ray fluorescence analysis (SR-TXRF) in combination with a multilayer structure for monochromatization led to detection limits in the femtogram range for medium-Z element
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4b372f79f368fdcf49d2ad058f8f4c4
https://doi.org/10.1002/(sici)1097-4539(199707)26:4<189::aid-xrs210>3.0.co
https://doi.org/10.1002/(sici)1097-4539(199707)26:4<189::aid-xrs210>3.0.co
Publikováno v:
X-Ray Spectrometry. 24:157-162
Direct measurement of the spectral distribution emitted by an x-ray tube with a solid-state detector is described. Spectral distributions of various x-ray tubes differing in anode material were measured and compared. Numerical values and relevant dat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::446ec9a0a143309c92acc7ba716d33f8
https://doi.org/10.1002/xrs.1300240403
https://doi.org/10.1002/xrs.1300240403
Publikováno v:
Advances in X-ray Analysis. 39:137-147
A method for measuring spectral distributions of x-ray tubes directly with a solid-state detector is presented. Different anode materials (chromium, molybdenum, rhodium and tungsten) have been measured. Results for various applied voltages and take-o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc9bf6c149fa27a99fc67acdf5679cc1
https://doi.org/10.1154/s0376030800022540
https://doi.org/10.1154/s0376030800022540
Publikováno v:
X-Ray Spectrometry. 21:37-42
A knowledge of the spectral distribution method emitted by an x-ray tube is important for all calculations in quantitative x-ray fluorescence analysis. A simple way of directly measuring the primary spectrum of an x-ray tube with a solid-state detect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::635bbca9ee0a0a211635f2535c3c9c68
https://doi.org/10.1002/xrs.1300210110
https://doi.org/10.1002/xrs.1300210110
Publikováno v:
Advances in X-Ray Analysis ISBN: 9780306458033
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3eb1a1cee9a6e894e5c27feba171b913
https://doi.org/10.1007/978-1-4615-5377-9_17
https://doi.org/10.1007/978-1-4615-5377-9_17
Autor:
Peter Fratzl, Jozef Keckes, P. Doppler, S. Marsoner, HF Jakob, Heinz Leitner, Alexander Bergmann, Kurt Erlacher, R. Görgl, L. Bruegemann
Publikováno v:
Scopus-Elsevier
A laboratory system (NanoSTAR) based on a combination of specially designed X-ray multilayer optics (Göbel Mirrors) with optical bench, pinhole collimators, sample changer and primary beam stop as well as a two dimensional multiwire detector (HI-STA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a1dc9aa971d95a3c1f82d94ba63e69b
http://www.scopus.com/inward/record.url?eid=2-s2.0-10744222924&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-10744222924&partnerID=MN8TOARS
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