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pro vyhledávání: '"R. E. Welser"'
Autor:
L. J. Guido, R. E. Welser
Publikováno v:
Applied Physics Letters. 68:912-914
The nucleation of InAs islands on (100) and (111)B GaAs substrates during metalorganic chemical vapor deposition has been investigated via scanning electron microscopy. The measured values of island density are 4–5 orders of magnitude smaller than
Controlled III–V semiconductor cluster nucleation and epitaxial growth via electron‐beam lithography
Publikováno v:
Applied Physics Letters. 66:1343-1345
Controlled registration of InAs clusters and selective‐area growth of InAs thin films on GaAs substrates is achieved via a combined high dose electron beam lithography/metalorganic chemical vapor deposition technique. Auger electron spectroscopy an
Publikováno v:
Extended Abstracts of the 1999 International Conference on Solid State Devices and Materials.
Autor:
R. E. Welser, O. A. Laboutin
Publikováno v:
Applied Physics Letters. 92:223103
Uncapped InN islands are grown on GaN buffer layers by low pressure metal-organic chemical vapor deposition. The buffer layer threading dislocation density is intentionally altered via the GaN growth pressure, as indicated by both the x-ray diffracti