Zobrazeno 1 - 2
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pro vyhledávání: '"R. D. Olney"'
Publikováno v:
Journal of Vacuum Science and Technology. 16:1897-1900
We report an entirely new pattern‐replication technique for IC fabrication. It has demonstrated submicrometer (
Publikováno v:
Journal of Vacuum Science and Technology. 16:1610-1612
Ion beams have increased usefulness for high‐resolution microstructure fabrication if they are patterned to small dimensions before they strike a target. First, results are presented of maskless micromachining, doping, and resist exposure with a sc