Zobrazeno 1 - 10
of 38
pro vyhledávání: '"R. Chauvistré"'
Autor:
R. Chauvistré, G. Ceballos, K. Baberschke, N. Haack, P. Srivastava, Heiko Wende, F. Wilhelm, Dimitri Arvanitis
Publikováno v:
Surface Science. 465:187-197
We report temperature- and angular-dependent surface extended X-ray absorption fine structure spectroscopy (SEXAFS) measurements of the p4g(2 x 2)C/Ni(100) system. Both a Ni(100) single crystal and ...
Autor:
J. Hunter-Dunn, K. Baberschke, John J. Rehr, N. Haack, R. Chauvistré, L. Lemke, Nils Mårtensson, Dimitri Arvanitis, Heiko Wende, P. C. Srivastava, A. L. Ankudinov
Publikováno v:
Journal of Physics: Condensed Matter. 10:1917-1930
We report normal and magnetic extended x-ray absorption fine-structure (EXAFS) measurements made on 30 ML Fe films on Cu(001) substrates at the edges. The magnetic EXAFS at the L edges of 3d metals is particularly important as it can be used to probe
Publikováno v:
Chemical Physics. 223:293-302
X-ray absorption near edge structure (XANES) measurements were carried out at the sulfur K-edge of nine sulfanes with the structure RSnR, n = 2–4. The discrete part of the XANES spectra of these sulfanes is expected to be quite similar under
Publikováno v:
ResearcherID
We report angle-dependent near-edge x-ray-absorption fine-structure measurements of tetragonal Ni films [0.6--14.4 monolayers (ML)] grown on a Cu(001) surface. The analysis of the Ni ${L}_{3,2}$ white-line intensities show that the density of $3d$ ho
Autor:
John J. Rehr, K. Baberschke, P. C. Srivastava, Heiko Wende, R. Chauvistré, F. May, Dimitri Arvanitis
Publikováno v:
Journal of Physics: Condensed Matter. 9:L427-L433
The presence of oscillatory structures in the atomic x-ray absorption background is reported for the first time for surface-EXAFS of cN/Cu(100) and N/Cu(110). Systematic analysis of this feature (AXAFS) and comparison to theory yields new information
Autor:
H. Henneken, R. Chauvistré, K. Baberschke, Dimitri Arvanitis, Heiko Wende, J. Hunter Dunn, M. Tischer, F. May
Publikováno v:
ResearcherID
Scopus-Elsevier
Scopus-Elsevier
Using magnetic circular X-ray dichroism (MCXD), Co/Ni, Cu/Co and Cu/Ni bilayers and Co/Cu/Ni and Ni/Cu/Co trilayers grown on a Cu(001) substrate were investigated. The Co layers were about 2 monolayers (ML) and the Ni layers were between 1.5 and 4.5
Autor:
K. Baberschke, H. Henneken, M. Russo, M. Tischer, Dunn Jh, Nils Mårtensson, Dimitri Arvanitis, Heiko Wende, F. May, R. Chauvistré
Publikováno v:
Scopus-Elsevier
We report near-edge x-ray-absorption fine-structure (NEXAFS) and magnetic circular x-ray dichroism (MCXD) measurements of 4-ML Ni films grown on Cu(100). The films were exposed to oxygen which then adsorbed in different adsorption states. The changes
Publikováno v:
Chemical Physics. 165:405-414
XANES and EXAFS spectra of P 4 O 6 , P 4 O 10 , triphenylphosphite and triphenylphosphate have been obtained at the phosphorus K edge using synchrotron radiation from the Bonn 2.5 GeV synchrotron. In order to point out the effects of symmetry distort
Publikováno v:
Acta Physica Polonica A. 82:37-50
Autor:
D. Arvanitis, H. Wende, L. Hemke, J. Hunter-Dunn, P. Srivastava, A. Ankudinov, N. Martensson, R. Chauvistré, N. Haack, K. Baberschke, J.J. Rehr
Publikováno v:
7th Joint MMM-Intermag Conference. Abstracts (Cat. No.98CH36275).