Zobrazeno 1 - 10
of 116
pro vyhledávání: '"R. Bouregba"'
Autor:
G. Poullain, Bernadette Domengès, Anthony Ferri, J. More-Chevalier, R. Bouregba, Rachel Desfeux, Christophe Cibert
Publikováno v:
Thin Solid Films
Thin Solid Films, 2017, 623, pp.138-146. ⟨10.1016/j.tsf.2016.12.032⟩
Thin Solid Films, Elsevier, 2017, 623, pp.138-146. ⟨10.1016/j.tsf.2016.12.032⟩
Thin Solid Films, 2017, 623, pp.138-146. ⟨10.1016/j.tsf.2016.12.032⟩
Thin Solid Films, Elsevier, 2017, 623, pp.138-146. ⟨10.1016/j.tsf.2016.12.032⟩
International audience; TbxDy1 − xFe2 (Terfenol-D) thin films were grown in situ at 500 °C on Pt/TiO2/SiO2/Si substrate by multi-target sputtering. The thickness effect of the Terfenol-D layer on the microstructure and on the magnetic properties w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e232356ff93bef0cbfe0e2d34289a3bb
https://hal.science/hal-01664862
https://hal.science/hal-01664862
Publikováno v:
Applied Surface Science. 273:645-651
TbxDy1−xFe2 thin films are grown on Pt/TiO2/SiO2/Si substrate by multi-target sputtering. In order to achieve the best magnetic properties, samples grown while heating the sample holder (in situ films) are compared to those prepared at room tempera
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43ce03b7c74535b659404e3b842afc58
https://doi.org/10.1016/j.apsusc.2013.02.101
https://doi.org/10.1016/j.apsusc.2013.02.101
Publikováno v:
Thin Solid Films
Thin Solid Films, Elsevier, 2013, 527, pp.327-333. ⟨10.1016/j.tsf.2012.11.098⟩
Thin Solid Films, 2013, 527, pp.327-333. ⟨10.1016/j.tsf.2012.11.098⟩
Thin Solid Films, Elsevier, 2013, 527, pp.327-333. ⟨10.1016/j.tsf.2012.11.098⟩
Thin Solid Films, 2013, 527, pp.327-333. ⟨10.1016/j.tsf.2012.11.098⟩
Polarization fatigue in ferroelectric perovskite oxides is a commonly known phenomenon. However no model has promoted consensual interpretation regarding its nature. In this article, the polarization loop of a Pb(Zr0.54Ti0.46)O3 thin film capacitor m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::150d2cea40b24bdf1aa81757e0cf4b03
https://doi.org/10.1016/j.tsf.2012.11.098
https://doi.org/10.1016/j.tsf.2012.11.098
Autor:
A. Fougerat, R. Bouregba, Sébastien Saez, Christophe Dolabdjian, Olivier Mareschal, G. Poullain, Gaelle Lissorgues, L. Valbin, S. Loiseau
Publikováno v:
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International, Apr 2009, Besançon, France. p894-897
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2010, 57 (3), pp.513-517. ⟨10.1109/TUFFC.2010.1441⟩
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Institute of Electrical and Electronics Engineers, 2010, 57 (3), pp.513-517. ⟨10.1109/TUFFC.2010.1441⟩
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International, Apr 2009, Besançon, France. p894-897
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2010, 57 (3), pp.513-517. ⟨10.1109/TUFFC.2010.1441⟩
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Institute of Electrical and Electronics Engineers, 2010, 57 (3), pp.513-517. ⟨10.1109/TUFFC.2010.1441⟩
Article sélectionnée parmi les acticles de : 23rd European Frequency and Time Forum/IEEE International Frequency Control Symposium, Besancon, FRANCE, APR 20-24, 2009; International audience; This work investigates properties of the thin film elonga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1075d1f9397af37e1db5a337668ac465
https://doi.org/10.1109/tuffc.2010.1441
https://doi.org/10.1109/tuffc.2010.1441
Akademický článek
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Publikováno v:
Applied Surface Science. 255:4293-4297
〈1 1 1〉-oriented Pb(Zr0.6Ti0.4)O3 thin films were elaborated in the same run by RF multitarget sputtering on Si/SiO2/TiO2/Pt(1 1 1) and LaAlO3/Pt(1 1 1) substrates. PZT thin films were textured, exhibiting 〈1 1 1〉 fibre texture on silicon sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bc61f0f92e196a5e2e896b50c03827e
https://doi.org/10.1016/j.apsusc.2008.11.033
https://doi.org/10.1016/j.apsusc.2008.11.033
Autor:
G. Poullain, Anthony Ferri, G. Leclerc, R. Bouregba, Sébastien Saitzek, Rachel Desfeux, A. Da Costa
Publikováno v:
Surface Science
Surface Science, Elsevier, 2008, 602 (11), pp.1987-1992. ⟨10.1016/j.susc.2008.04.001⟩
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2008, 602 (11), pp.1987-1992. ⟨10.1016/j.susc.2008.04.001⟩
Surface Science, Elsevier, 2008, 602 (11), pp.1987-1992. ⟨10.1016/j.susc.2008.04.001⟩
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2008, 602 (11), pp.1987-1992. ⟨10.1016/j.susc.2008.04.001⟩
(1 1 1)-oriented Pb 0.85 La 0.1 Zr 0.4 Ti 0.6 O 3 (PLZT 10/40/60) thin films with thickness of 50 nm, 135 nm, 270 nm, 380 nm and 650 nm have been grown on TiO x /Pt(1 1 1)/TiO 2 /SiO 2 /Si substrates. Surface morphology, ferroelectric domain architec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e59e9a04e52d02dab5c6ecbeef70478
https://doi.org/10.1016/j.susc.2008.04.001
https://doi.org/10.1016/j.susc.2008.04.001
Publikováno v:
Applied Surface Science. 254:3867-3872
Pb1−2y/3LayZrxTi1−xO3 (PLZT) thin films have been prepared “in situ” by multi-target sputtering on Silicon, LaAlO3 (LAO) and MgO substrates covered with a Pt bottom electrode. The purpose was to grow tetragonal PLZT films (Zr/Ti = 28/72 with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4b900b88dc4d1cde975ff651875926c
https://doi.org/10.1016/j.apsusc.2007.12.008
https://doi.org/10.1016/j.apsusc.2007.12.008
Publikováno v:
Thin Solid Films. 515:1835-1846
A model based on trapping and releasing of free carriers in band gap states located at the interfaces between electrodes and the ferroelectric film is used to explain the restoration of polarization which is sometimes observed. Experimental data on t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0233fbb7d4bda81a699783aba3c03809
https://doi.org/10.1016/j.tsf.2006.07.010
https://doi.org/10.1016/j.tsf.2006.07.010
Publikováno v:
Applied Surface Science. 253:1143-1149
PLZT thin films with different thickness were deposited in situ on platinum coated silicon substrates using a multi-target sputtering system. The purpose was to grow (1 1 1)-textured PLZT films on Pt (1 1 1). To this aim, the role of some key paramet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b557db5459259a60e15d969303547b8
https://doi.org/10.1016/j.apsusc.2006.01.048
https://doi.org/10.1016/j.apsusc.2006.01.048