Low-Temperature Synchrotron Radiation Study of a Twinned Disordered Crystal of Bis(4,4'-bromophenyl)-61,61-diyl Methano Fullerene C60

Autor: Philip Coppens, R. Bolotovsky, Alex Darovsky, Bo B. Iversen

Publikováno v: Acta Crystallographica Section B Structural Science. 54:174-179

Synchrotron radiation diffraction measurements at 100 (5) K have been carried out on bis(4,4′-bromophenyl)-61,61-diyl methano fullerene C60 using area detector technology. In order to obtain a satisfactory description of the data it is necessary to

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::57a8e90a966f0648aca21d404b3518f6
https://doi.org/10.1107/s0108768197012007

The 'Seed-Skewness' Method for Integration of Peaks on Imaging Plates II. Analysis of Bias Due to Finite Size of the Peak Mask and Treatment of α1-α2Splitting

Autor: P. Coppens, R. Bolotovsky

Publikováno v: Journal of Applied Crystallography. 30:244-253

The conditions for the skewness minimum in the seed-skewness algorithm for integration of diffraction maxima on imaging plates are examined. Theoretical estimates of the bias in the integrated intensities due to finite size of the peak mask are deriv

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bc70b6d9ad4010bb804be2efc1159bc6
https://doi.org/10.1107/s0021889896010205

The Use of Imaging Plates in Electron-Density Mapping with Synchrotron X-rays

Autor: R. Bolotovsky, A. Darovsky, V. Kezerashvili, Philip Coppens

Publikováno v: Journal of Synchrotron Radiation. 2:181-184

Imaging-plate synchrotron data have been applied in the charge-density analyses of sodium nitroprusside and hexaamminechromium(III) hexacyanochromate(lll), collected at 100 and 50 K, respectively, and photons of wavelengths 0.656 and 0.394 A at the S

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b3e1758f6f41f2201a838b9eb77ef3cb
https://doi.org/10.1107/s0909049595006170

The use of partially recorded reflections for post refinement, scaling and averaging X-ray diffraction data

Autor: R. Bolotovsky, C. G. van Beek, Michael G. Rossmann

Publikováno v: International Tables for Crystallography ISBN: 9780470660782
International Tables for Crystallography ISBN: 9780792368571
International Tables for Crystallography

Previous methods used for placing diffraction data recorded on a set of image frames onto a common scale have depended on finding scale factors that minimize the difference between scaled, fully recorded reflections. However, frozen crystals usually

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dee7cbd5529471ba128ad4621677cd7d
https://doi.org/10.1107/97809553602060000834

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