Zobrazeno 1 - 10
of 21
pro vyhledávání: '"R. B. Bylsma"'
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:1285-1288
Scanning spreading resistance microscopy (SSRM) is a powerful tool originally developed for measuring two-dimensional (2D) carrier distributions in Si device structures with nm spatial resolution. Whereas its application has been explored in detail o
Autor:
Julia W. P. Hsu, E. Betzig, C.C. Bahr, J. K. Trautman, R. B. Bylsma, S. K. Buratto, M. J. Cardillo
Publikováno v:
Journal of Applied Physics. 76:7720-7725
The application of near-field scanning optical microscopy (NSOM) to the characterization of InGaAsP multiquantum-well lasers is reported. Collection mode images are collected at varying drive currents from well below to well above the threshold curre
Publikováno v:
Applied Physics Letters. 73:2155-2157
Scanning spreading resistance microscopy (SSRM) is an analytical technique originally developed for measuring two-dimensional carrier distribution in Si device structures with high spatial resolution. It is in essence an atomic force microscope equip
Autor:
J. K. Trautman, Julia W. P. Hsu, C.C. Bahr, R. B. Bylsma, M. J. Cardillo, S. K. Buratto, E. Betzig
Publikováno v:
Applied Physics Letters. 65:2654-2656
A new contrast method in near-field scanning optical microscopy in which the near-field probe is used to excite photocurrent in a semiconductor sample is described and demonstrated. The use of near-field optics results in an order-of-magnitude improv
Publikováno v:
Electronics Letters. 26:482
Device performance of GaAs metal-semiconductor field effect transistors (MESFETs) grown by metalorganic chemical vapour deposition (MOCVD) on InP substrates using tertiarybutylarsine (t-BuAsH/sub 2/) is reported. The 1 mu m gate FETs have a maximum e
Autor:
A.T. Macrander, Timothy D. Harris, R. B. Bylsma, J. K. Klingert, M. G. Lamont, R. M. Lum, Alastair M. Glass
Publikováno v:
Journal of Applied Physics. 64:6727-6732
GaAs hereroepitaxial films on Si contain a high number of misfit dislocations and large internal stresses due to the lattice and thermal mismatch of the two materials. These greatly affect the structural, optical, and electrical properties of the fil
Publikováno v:
Physical Review B. 33:8207-8215
Photoluminescence and reflectivity measurements have been carried out on ${\mathrm{Zn}}_{1\mathrm{\ensuremath{-}}\mathrm{x}}$${\mathrm{Mn}}_{\mathrm{x}}$Se solid solutions in the complete range of crystal compositions, 0\ensuremath{\le}x\ensuremath{\
Autor:
Jacek K. Furdyna, T. C. Bonsett, Supriyo Datta, W. M. Becker, Robert L. Gunshor, R. B. Bylsma, Nobuo Otsuka, M. Yamanishi, L.A. Kolodziejski
Publikováno v:
Journal of Crystal Growth. 72:294-298
Cd 1− x Mn x Te superlattices with periodically varying Mn content have recently been grown epitaxially on (100) GaAs substrates. Two orientations of the epilayer, (100) and (111), have been reported by different research groups. Recent experiments
Autor:
W. M. Becker, R. B. Bylsma, Leslie A. Kolodziejski, Jacek Kossut, Robert L. Gunshor, R. Frohne
Publikováno v:
Journal of Applied Physics. 61:3011-3019
Measurements of photoluminescence and photoluminescence excitation spectra at liquid helium temperatures are presented for films of ZnSe, Zn1−xMnxSe (0≤x≤0.33), and multilayer structures ZnSe/Zn1−xMnxSe (x=0.23, 0.33, and 0.51) grown by molec
Publikováno v:
Applied Physics Letters. 51:889-891
The first study of the photorefractive properties of doped CdTe has demonstrated high sensitivity for optical processing applications. Of the binary II‐VI and III‐V semiconductors, CdTe has the highest electro‐optic coefficient r41 in the infra