Zobrazeno 1 - 10
of 27
pro vyhledávání: '"R. A. Synowicki"'
Publikováno v:
Physical chemistry chemical physics : PCCP. 23(15)
Lithium fluoride films were prepared by atomic layer deposition (ALD) using a new route in which LiN(SiMe
Publikováno v:
Applied Surface Science. 421:824-830
The optical constants of an opaque electroplated gold film (Laser Gold from Epner Technology Inc.), were determined by spectroscopic ellipsometry at room temperature over the spectral range from 0.142 μm in the vacuum ultraviolet to 36 μm in the in
Autor:
Adriaan J. M. Mackus, Martijn F. J. Vos, R. A. Synowicki, Harm C. M. Knoops, Wilhelmus M. M. Kessels
Publikováno v:
Applied Physics Letters, 111(11):113105. American Institute of Physics
Metal fluorides typically have a low refractive index and a very high transparency and find many applications in optical and optoelectronic devices. Nearly stoichiometric, high-purity AlF3 films were deposited by atomic layer deposition (ALD) using t
Autor:
R. A. Synowicki, Neil McN. Alford, James Lloyd-Hughes, V. R. Palkar, Anna-Karin Axelsson, R. D. Johnson, Frederic Aguesse, S. P. P. Jones, K. I. Doig, S. Nawaz
Coherent magnons and acoustic phonons were impulsively excited and probed in thin films of the room temperature multiferroic Bi${}_{1\ensuremath{-}x\ensuremath{-}y}$Dy${}_{x}$La${}_{y}$FeO${}_{3}$ using femtosecond laser pulses. The elastic moduli of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c945f61ecd9ac12a32c8e3af447b2b27
https://ora.ox.ac.uk/objects/uuid:bf4d5497-f1a1-4f65-9222-8d992b192c6f
https://ora.ox.ac.uk/objects/uuid:bf4d5497-f1a1-4f65-9222-8d992b192c6f
Publikováno v:
Surface Science Spectra. 25:026001
Polydimethylsiloxane (PDMS) is an important polymer with numerous applications. Herein, the authors report the optical function(s) of PDMS from 191 to 1688 nm as determined from reflection spectroscopic ellipsometry (SE) and transmission ultraviolet-
Autor:
Thomas E. Tiwald, R. A. Synowicki
Publikováno v:
Thin Solid Films. :248-255
In this paper spectroscopic ellipsometry is used to determine the dielectric function (refractive index) of three bulk materials: cubic zirconia (c-ZrO2), cubic magnesium oxide (c-MgO) and amorphous (vitreous) arsenic sulfide (a-As2S3) from 130 nm in
Publikováno v:
Thin Solid Films. :624-627
Deuterated potassium dihydrogen phosphate (DKDP) is used for third harmonic generation (frequency tripling) in high power laser applications [Ferroelectrics, 72, 1987, 397–441; Int. Mater. Rev. 47, 2002, 113–152]. DKDP is a uniaxial anisotropic c
Publikováno v:
Wiley Encyclopedia of Electrical and Electronics Engineering
The sections in this article are 1 Basic Concepts: How do Ellipsometers Work? 2 Instrumentation 3 Applications 4 Future Directions of Spectroscopic Ellipsometry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3348b87f2c5970f39ff9c4816ea3ca15
https://doi.org/10.1002/047134608x.w4039.pub2
https://doi.org/10.1002/047134608x.w4039.pub2
Publikováno v:
Surface and Coatings Technology. 90:150-155
Thin films of aluminum were exposed in short increments to a plasma environment using a semiconductor plasma asher. The process gas was a mixture of air and oxygen. The total exposed oxygen fluence was 1.2 × 10 21 oxygen atoms cm −2 accumulated ov
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 14:3075-3081
The low Earth orbit ~LEO! environment is commonly simulated using oxygen plasma ashers to determine the effects of LEO on spacecraft materials. However, plasma ashers can also contaminate samples during plasma exposure, making them less than ideal fo