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Publikováno v:
Front. Cell. Neurosci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=r3c4b2081b22::ab9cf766537773768b7b9a1357f2fb14
Publikováno v:
World of Transport and Transportation. 14:266-271
For the English abstract and full text of the article please see the attached PDF-File (English version follows Russian version).ABSTRACT The book, published in the series «World of Radio Electronics», is addressed to those involved in unmanned aer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfe079bafcbf777593f5d05eb7872569
https://doi.org/10.30932/1992-3252-2016-14-5-27
https://doi.org/10.30932/1992-3252-2016-14-5-27
Autor:
Jerome K. Butler, Gary A. Evans, Ralph H. Johnson, James R. Biard, Hsueh-hua Chuang, J.K. Guenter
Publikováno v:
IEEE Journal of Quantum Electronics. 43:1028-1040
This paper presents an iterative model for the analysis of the current distribution in vertical-cavity surface-emitting lasers (VCSELs) using a SPICE-like approach. The model includes a degeneracy correction for operation at and above threshold. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5027d0e3b817aeb789fdbe29ed25a5dc
https://doi.org/10.1109/jqe.2007.905005
https://doi.org/10.1109/jqe.2007.905005
Autor:
Forrest R. Biard
Publikováno v:
Cryptologia. 30:151-158
This is the text of a speech by CAPT Forrest R. “Tex” Biard (Ret) given to the National Cryptologic Museum Foundation on 14 June 2002. It has been edited by our editor David Kahn. We are grateful to Graydon A. Lewis former editor of the Naval Cry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d9cc506c02d273abafead650cc85d24
https://doi.org/10.1080/01611190500380074
https://doi.org/10.1080/01611190500380074
Autor:
Laszlo B. Kish, James R. Biard
Publikováno v:
Fluctuation and Noise Letters. :L153-L158
In this Letter, we propose a simple method to strongly enhance the sensitivity of the detection of the new technique called "SEnsing of Phage-Triggered Ion Cascade (SEPTIC)". The method accumulates those phage infected bacteria which are emitting ion
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94c6d3167251e4b9fe04892f309997c9
https://doi.org/10.1142/s0219477505002513
https://doi.org/10.1142/s0219477505002513
Publikováno v:
IEEE Journal of Quantum Electronics. 34:2233-2240
The electrical characteristics of proton-implanted GaAs quantum-well vertical-cavity surface-emitting semiconductor lasers (VCSEL's) have been studied. We show that the 2kT current, observed over many decades in these VCSEL's, is primarily due to non
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a35d9362251b564fb7d05a12e7118489
https://doi.org/10.1109/3.726619
https://doi.org/10.1109/3.726619
Autor:
Ralph H. Johnson, D. Gazula, James R. Biard, Jimmy A. Tatum, Gyoungwon Park, Jerome K. Wade, Gary Landry, James K. Guenter, Andrew N. MacInnes
Publikováno v:
SPIE Proceedings.
In this paper we will discuss recent results on high speed VCSELs targeted for the emerging 16GFC (Fibre Channel) standard as well as the now forming 25Gbps PCI express standard. Significant challenges in designing for reliability and speed have been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c522e9634c762791e743341db4892ce7
https://doi.org/10.1117/12.841012
https://doi.org/10.1117/12.841012
Publikováno v:
2007 International Conference on Numerical Simulation of Optoelectronic Devices.
A simple iterative model is developed for the analysis of the current distribution in multi-mode vertical cavity surface emitting lasers (VCSELs) using a SPICE-like approach. The model includes the measured sheet resistances as input parameters, drif
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::052ddbf9d65a32049866889d759b80d7
https://doi.org/10.1109/nusod.2007.4349020
https://doi.org/10.1109/nusod.2007.4349020
Publikováno v:
52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
This paper presents Honeywell's most recent work on 850 nm oxide aperture vertical cavity surface emitting laser (VCSEL) reliability. The VCSELs studied have a range of aperture diameters from about 5 to 20 /spl mu/m and the reliability effect of ape
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a70dba0c696667b86f69720f3c87a9e
https://doi.org/10.1109/ectc.2002.1008148
https://doi.org/10.1109/ectc.2002.1008148