Zobrazeno 1 - 10
of 67
pro vyhledávání: '"R W Carpenter"'
Autor:
Ronit Sawant, R W Carpenter
Publikováno v:
Microscopy and Microanalysis. 28:2394-2396
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8938748191d4bbca506826a92ba113dd
https://doi.org/10.1017/s1431927622009187
https://doi.org/10.1017/s1431927622009187
Publikováno v:
Metallurgical and Materials Transactions A. 33:437-442
The diffusion-bonding behavior of single-phase austenitic stainless steel depends strongly on the chemistry of the surfaces to be bounded. We found that very smooth (0.5 nm root-mean-square (RMS) roughness), mechanically polished and lapped substrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f0d691b3df3a6466249f67dac3df349
https://doi.org/10.1007/s11661-002-0104-7
https://doi.org/10.1007/s11661-002-0104-7
Publikováno v:
Journal of Materials Research. 14:1032-1038
Single Ti layers, single TiN layers, and thin Ti films overlayered with Au were investigated as ohmic contacts to n-type (n 4.5 × 1017 to 7.4 × 1018 cm−3) single-crystal GaN (0001) films. Transmission line measurements (TLM) revealed the as-depos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e46610f61ffb133d65a6b378aab32d43
https://doi.org/10.1557/jmr.1999.0137
https://doi.org/10.1557/jmr.1999.0137
Autor:
R. W. Carpenter
Publikováno v:
Journal of Materials Synthesis and Processing. 6:345-358
Instrumentation requirements, particularly for small probes, for high resolution analytical electron microscopy are described. Analysis of structure and chemistry of interfaces in conventionally processed Si3N4/SiC(w) ceramic matrix composites (CMCs)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::487037628921371f5b9cb71ef4de7643
https://doi.org/10.1023/a:1022607428479
https://doi.org/10.1023/a:1022607428479
Publikováno v:
Journal of The Electrochemical Society. 141:1856-1862
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d60722a07108e0136ec05aa0fd78c4ff
https://doi.org/10.1149/1.2055017
https://doi.org/10.1149/1.2055017
Publikováno v:
Journal of Applied Physics. 73:7422-7426
The band structure of hexagonal boron nitride (BN) has been calculated using an ab initio linear combination of pseudoatomic‐orbitals method. The calculated band structure confirms a previous finding that this material is an indirect band‐gap ins
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb21d2780ef5aa2ba97cd4d7e92de107
https://doi.org/10.1063/1.353983
https://doi.org/10.1063/1.353983
High-resolution electron microscopy and microanalysis of CdS and CdTe quantum dots in glass matrices
Publikováno v:
Philosophical Magazine B. 63:769-776
CdS and CdTe auantum dots (QDs) precipitated from borosilicate glass matrices, exhibiting auantum confinement effects, have been characterized by optical spectroscopy and high-spatial-resolution electron microscopy. The particles appear to have forme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ff2630d49a1e12aef1a29c66a750689
https://doi.org/10.1080/13642819108225985
https://doi.org/10.1080/13642819108225985
Autor:
M. J. Kim, R. W. Carpenter
Publikováno v:
Journal of Materials Research. 5:347-351
Compositional analysis of thin nanoscale native oxide films formed on {001} silicon wafer surfaces at room temperature was done with an electron energy loss spectrometer coupled to an analytical electron microscope having a field emission source, wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::23121d86b286ce554b3101de4cdafe37
https://doi.org/10.1557/jmr.1990.0347
https://doi.org/10.1557/jmr.1990.0347
Military Operations in Urban Terrain present challenges that differ from those of conventional warfare. Often these arise because only limited force can be applied. To compensate, precise information about an opponent's location and condition is desi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::081cd1565058aa04af789c1f57715849
https://doi.org/10.21236/ada398084
https://doi.org/10.21236/ada398084
