Zobrazeno 1 - 10
of 259
pro vyhledávání: '"R W, van der Heijden"'
Publikováno v:
The Journal of Immunology. 146:1503-1508
We previously demonstrated the occurrence of a naturally arisen human anti-idiotypic B cell clone, that we transformed with EBV (EBV383). We show evidence that EBV383 not only expresses the CD5 surface Ag, but also contains the 2.7-kb mRNA transcript
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e44b9951dce5d51373a7346ad060b07
https://doi.org/10.4049/jimmunol.146.5.1503
https://doi.org/10.4049/jimmunol.146.5.1503
Publikováno v:
The Journal of Immunology. 144:2835-2839
We previously described the isolation and characterization of a human monoclonal anti-idiotypic antibody (Ab2) isolated from EBV-transformed human PBL after immunization with rabies vaccine. The present study concerns the molecular characteristics of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80321d2c0f1864f24e6067185b21e06e
https://doi.org/10.4049/jimmunol.144.7.2835
https://doi.org/10.4049/jimmunol.144.7.2835
Publikováno v:
Current topics in microbiology and immunology. 191
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::6690c74b8c41a48ce3d6fe15cccf3edb
https://pubmed.ncbi.nlm.nih.gov/7789157
https://pubmed.ncbi.nlm.nih.gov/7789157
Publikováno v:
Journal of Applied Physics. 55:1003-1011
High‐frequency radiation detection by metal‐metal point contacts is investigated as a function of bias voltage at far‐infrared frequencies. Detection occurs through rectification due to a nonlinearity of the current‐voltage characteristic. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb02cc707c270838228853caad2d01b4
https://doi.org/10.1063/1.333192
https://doi.org/10.1063/1.333192
Autor:
Sojo-Gordillo, Jose M., Kaur, Yashpreet, Tachikawa, Saeko, Alayo, Nerea, Salleras, Marc, Forrer, Nicolas, Fonseca, Luis, Morata, Alex, Tarancón, Albert, Zardo, Ilaria
Publikováno v:
Nanoscale Horizons; Jul2024, Vol. 9 Issue 7, p1200-1210, 11p
Publikováno v:
In Microelectronics Reliability 1990 30(5):1017-1017
Autor:
Vermani, Kunal1 vermanikunal@gmail.com, Noliya, Amandeep1 am.noliya@gmail.com, Kumar, Sunil1 sunilkaushik27@gmail.com, Dutta, Kamlesh2 kd@nith.ac.in
Publikováno v:
Journal of Information Systems Engineering & Business Intelligence. Oct2023, Vol. 9 Issue 2, p136-146. 11p.
Autor:
Gong Z; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Lai X; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Miao W; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Zhong J; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Shi Z; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Shen H; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Liu X; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Li Q; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Yang M; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Zhuang J; School of Physics, Beihang University, Haidian District, Beijing, 100191, China., Du Y; School of Physics, Beihang University, Haidian District, Beijing, 100191, China.
Publikováno v:
Small methods [Small Methods] 2024 Dec; Vol. 8 (12), pp. e2400517. Date of Electronic Publication: 2024 May 19.
Publikováno v:
International Journal of Advanced Computer Science & Applications; 2024, Vol. 15 Issue 2, p410-418, 9p
Autor:
Khisameeva, A. R.1 (AUTHOR) akhisameeva@issp.ac.ru, Shchepetilnikov, A. V.1,2 (AUTHOR), Nefyodov, Yu. A.1 (AUTHOR), Kukushkin, I. V.1 (AUTHOR)
Publikováno v:
JETP Letters. Sep2021, Vol. 114 Issue 5, p279-283. 5p.