Zobrazeno 1 - 3
of 3
pro vyhledávání: '"R R Habeb"'
Autor:
R R Habeb, Peter Kinnell
Publikováno v:
Measurement Science Review, Vol 13, Iss 6, Pp 305-310 (2013)
In 3D tactile micro-metrology the contamination of probing devices is a major problem that affects the accuracy and repeatability of measured dimensions. Despite a large body of research in the field of micro CMM and micro probe design there is limit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eb9241f185f324359bde02671dc89f3f
https://doaj.org/article/01f717a0a30c4bd49addd69af850e1a0
https://doaj.org/article/01f717a0a30c4bd49addd69af850e1a0
Autor:
R R Habeb, Peter Kinnell
Publikováno v:
Procedia Engineering. 47:306-309
To support the manufacture of complex products, which many are made of multiple micro-parts, a traceable and accurate 3D-measurement system with sub-micron accuracy is required. This work investigates the use of a commercially-available MEMS-tactile-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f44085c99082085cfb7215c05f702aeb
https://doi.org/10.1016/j.proeng.2012.09.144
https://doi.org/10.1016/j.proeng.2012.09.144
Autor:
R R Habeb, Peter Kinnell
Publikováno v:
Measurement Science and Technology. 24:085603
To support the manufacture of complex products made of multiple micro-parts, a traceable and accurate 3D-measurement system with sub-micron accuracy is required. This paper investigates the use of a micro electro mechanical system (MEMS) tactile-micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e04229ce6e483f6520b94e07b560fa63
https://doi.org/10.1088/0957-0233/24/8/085603
https://doi.org/10.1088/0957-0233/24/8/085603