Zobrazeno 1 - 3
of 3
pro vyhledávání: '"R N Pujari"'
Publikováno v:
Radiation Protection and Environment, Vol 43, Iss 2, Pp 94-99 (2020)
World over there have been isolated cases of reported radiation emergencies, occurring at a very small probability. Environmental radiation mapping of vast area using mobile platforms is one of the methodologies used for quick radiological assessment
Externí odkaz:
https://doaj.org/article/b34d6524dda34302b22fc91efe40581d
Autor:
G. Tsutsui, S. Song, J. Strane, R. Xie, L. Qin, C. Zhang, D. Schmidt, S. Fan, B. Hong, Y. Jung, C-W. Sohn, I. Hwang, J. Yim, G. H. Son, G. Jo, K-I. Kim, M. Sankarapandian, S. Mochizuki, I. Seshadri, E. Miller, J. Li, J. Demarest, C. Waskiewicz, R. G. Southwick, H. Zhou, R. N. Pujari, P. Nieves, M. Wang, H. Jagannathan, B. Anderson, D. Guo, R. Divakaruni, T. Wu, K-I. Seo, H. Bu
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0064f8c338daf52cc73fe7a373b8ea95
https://doi.org/10.1109/iedm45625.2022.10019393
https://doi.org/10.1109/iedm45625.2022.10019393
Autor:
Adra Carr, Shanti Pancharatnam, Gabriel Rodriguez, L. White, Brock Mendoza, W. Wang, Scott DeVries, R. N. Pujari, Gauri Karve, Mary Breton, Jean E. Wynne
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 32:374-380
The changes in tungsten (W) film growth and resistance are studied using different titanium nitride (TiN) and tantalum nitride (TaN) underlayer films. The underlayers are analyzed by surface characterization techniques to obtain the differences in su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e965d5b6a1a4b5a792768fb0e5af335c
https://doi.org/10.1109/tsm.2019.2945916
https://doi.org/10.1109/tsm.2019.2945916