Zobrazeno 1 - 10
of 25
pro vyhledávání: '"R Eckhard"'
Autor:
R. Eckhard, A. Gola, Antonio Francesco Longoni, Peter Lechner, Lothar Strüder, Heike Soltau, Adrian Niculae, Carlo Fiorini, R. Peloso
Publikováno v:
SPIE Proceedings.
Silicon Drift Detectors (SDDs) ar e used as low-capacitance photon detectors for the optical light emitted by scintillators. The scintillator crystal is directly coupled to the SDD entrance window. The entrance window's transmittance can be optimized
Autor:
A. Liebl, Adrian Niculae, Gerhard Schaller, Peter Lechner, Lothar Strüder, G. Lutz, Florian Schopper, R. Eckhard, Heike Soltau
Publikováno v:
Microscopy and Microanalysis. 13
Minimization of the total detector capacitance due the small area readout node on one hand and to the integration of the front-end FET directly onto the detector (see Fig. 1a) on the other hand, combined with an ultra-low leakage current process make
Autor:
Peter Holl, Robert Hartmann, Andrea Castoldi, Lothar Strüder, R. Eckhard, Heike Soltau, Adrian Niculae, A. Liebl, Peter Lechner, Norbert Meidinger, Gerhard Schaller, G. Lutz, Chiara Guazzoni, Florian Schopper
Publikováno v:
Microscopy and Microanalysis. 13
Autor:
Lothar Strüder, Antonio Francesco Longoni, Adrian Niculae, Carlo Fiorini, Gerhard Schaller, Peter Lechner, G. Lutz, Florian Schopper, R. Eckhard, Heike Soltau
Publikováno v:
Microscopy and Microanalysis. 11
Autor:
Adrian Niculae, Carlo Fiorini, Peter Lechner, G. Lutz, Florian Schopper, R. Eckhard, Antonio Francesco Longoni, Heike Soltau, Lothar Strüder, Gerhard Schaller
Publikováno v:
Microscopy and Microanalysis. 11
Autor:
Adrian Niculae, O. Jaratschin, Florian Schopper, Gerhard Schaller, Heike Soltau, Lothar Strüder, A. Liebl, Peter Lechner, K. Hermenau, A. Simsek, A Bechtele, R. Eckhard, G. Lutz
Publikováno v:
Microscopy and Microanalysis. 14:1156-1157
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Autor:
Gerhard Schaller, A. Liebl, Florian Schopper, Peter Lechner, R. Eckhard, Antonio Francesco Longoni, G. Lutz, Adrian Niculae, Lothar Strüder, Heike Soltau
Publikováno v:
Microscopy and Microanalysis. 12:862-863
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Autor:
G. Lutz, Gerhard Schaller, H. Soltau, A. Liebl, A. Niculae, P. Lechner, R. Eckhard, F. Schopper, L. Strüder
Publikováno v:
Powder Diffraction. 22:178-178
Autor:
F. Schopper, A. Niculae, G. Lutz, H. Soltau, Gerhard Schaller, P. Lechner, R. Eckhard, A. Liebl, L. Strüder
Publikováno v:
Powder Diffraction. 21:182-182
Autor:
P. Lechner, R. Eckhard, Carlo Fiorini, Antonio Francesco Longoni, H. Soltau, F. Schopper, Gerhard Schaller, L. Strüder, G. Lutz, A. Niculae
Publikováno v:
Powder Diffraction. 20:185-185