Zobrazeno 1 - 10
of 39
pro vyhledávání: '"R A Paynter"'
Autor:
R. W. Paynter, Daniel Peykov
Publikováno v:
Surface and Interface Analysis. 48:54-63
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::039f805bb324cb95b76aa94279c4abaf
https://doi.org/10.1002/sia.5881
https://doi.org/10.1002/sia.5881
Autor:
R. W. Paynter, M. Rondeau
Publikováno v:
Surface and Interface Analysis. 42:117-122
Angle-resolved X-ray photoelectron spectroscopy (ARXPS) data taken on a polystyrene film exposed to a nitrogen plasma are interpreted by the fitting of regularized depth profiles. Three ways of measuring the goodness of fit are compared—the χ2 sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::884921f8792edbe0d5639d071627dec1
https://doi.org/10.1002/sia.3173
https://doi.org/10.1002/sia.3173
Autor:
Robert L. Opila, Thierry Conard, John T. Grant, Julia E. Fulghum, Keisuke Kobayashi, H. Nohira, Robert M. Wallace, J. Wolstenholme, G. Conti, Alberto Herrera-Gomez, László Kövér, Francisco S. Aguirre-Tostado, Wolfgang S. M. Werner, S. Oswald, R. W. Paynter, C. R. Brundle, M. Jenko, Peter J. Cumpson, Charles S. Fadley
Publikováno v:
Surface and Interface Analysis. 41:840-857
Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’ A. Herrera-Gomez,a,b∗ J. T. Grant,c P. J. Cumpson,d† M. Jenko,e F. S. Aguirre-Tostado,b C. R. Br
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1eea9e56f4a89b7ff5eb791f6f9a151d
https://doi.org/10.1002/sia.3105
https://doi.org/10.1002/sia.3105
Autor:
R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 41:595-601
Polystyrene films were exposed to nitrogen plasmas for periods up to 8 min. Angle-resolved X-ray photoelectron spectroscopy measurements revealed the presence of oxygen and nitrogen in the surface due to the plasma treatment. The depth profiles of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a778b36f3a7fa9ae9ba2f492df9d156d
https://doi.org/10.1002/sia.3069
https://doi.org/10.1002/sia.3069
Publikováno v:
Surface and Interface Analysis. 39:445-451
Polystyrene films were exposed to nitrogen plasmas for periods up to 4 min. ARXPS measurements revealed the presence of oxygen and nitrogen in the surface because of the plasma treatment. The depth profiles of these adatoms were determined by fitting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ef295a542af5ffad9d68637d3b9ba70
https://doi.org/10.1002/sia.2538
https://doi.org/10.1002/sia.2538
Autor:
M. Ménard, R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 37:466-471
Angle-resolved x-ray photoelectron spectroscopy (ARXPS) measurements were made, using Al Ka and Mg Ka radiation alternately, on a polystyrene sample that had been exposed to a helium plasma. It was observed that oxygen was introduced into the sample
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f88ab8f15cb4e92c48a323141624eb1b
https://doi.org/10.1002/sia.2036
https://doi.org/10.1002/sia.2036
Autor:
M.‐C. Tremblay, R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 35:502-514
Angle-resolved x-ray photoelectron spectroscopy (ARXPS) measurements were made, in repeated sequences employing Al and Mg x-ray sources alternately, on a polystyrene sample that had been exposed to an oxygen plasma. It was observed that oxygen was lo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d89b645bc8d088317740cc0aaa4070a6
https://doi.org/10.1002/sia.1564
https://doi.org/10.1002/sia.1564
Autor:
D. Nolet, R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 35:960-967
In this study a silicon wafer was analysed by angle-resolved x-ray photoelectron spectroscopy and the data compared with a calculation based upon a simple model of the sample surface. The parameters in the mathematical model were varied in groups of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93e5e58d6401c6016f5cdda67b8b44b8
https://doi.org/10.1002/sia.1630
https://doi.org/10.1002/sia.1630
Autor:
R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 35:932-939
Error surfaces are calculated for the fitting of concentration–depth profiles to angle-resolved x-ray photoelectron spectroscopy (ARXPS) data. The shapes of the error surfaces indicate that model parameters related to composition (especially at the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f9b3f38142b0fc98f2d9bf5ce615f44
https://doi.org/10.1002/sia.1629
https://doi.org/10.1002/sia.1629
Autor:
R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 33:14-22
Polystyrene films spin-coated onto glass were exposed to an oxygen/argon plasma. The depth profile of the oxygen in the polystyrene surface was characterized by angle-resolved x-ray photoelectron spectroscopy (ARXPS) 2, 24 and 92 h following the plas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::645aed1f2c56c0521e926215f856deb1
https://doi.org/10.1002/sia.1155
https://doi.org/10.1002/sia.1155