Zobrazeno 1 - 10
of 1 370
pro vyhledávání: '"R A Paynter"'
Autor:
Kratter, Andrew W.
Publikováno v:
The Condor, 1996 Aug 01. 98(3), 664-664.
Externí odkaz:
https://www.jstor.org/stable/1369585
Autor:
Patterson, Bruce D.
Publikováno v:
Journal of Mammalogy, 1992 May 01. 73(2), 462-463.
Externí odkaz:
https://www.jstor.org/stable/1382089
Autor:
Vaurie, Charles
Publikováno v:
The Quarterly Review of Biology, 1964 Dec 01. 39(4), 407-408.
Externí odkaz:
https://www.jstor.org/stable/2818272
Publikováno v:
The Auk, 1978 Oct 01. 95(4), 777-777.
Externí odkaz:
https://www.jstor.org/stable/4085387
Autor:
Andrew W. Kratter
Publikováno v:
The Condor. 98:664-664
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9132159966d8ed79953744dbcf46c8ff
https://doi.org/10.2307/1369585
https://doi.org/10.2307/1369585
Autor:
Charles Vaurie
Publikováno v:
The Quarterly Review of Biology. 39:407-408
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3194907b50afb91d6c2d135e51d324f
https://doi.org/10.1086/404386
https://doi.org/10.1086/404386
Autor:
R. W. Paynter, Daniel Peykov
Publikováno v:
Surface and Interface Analysis. 48:54-63
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::039f805bb324cb95b76aa94279c4abaf
https://doi.org/10.1002/sia.5881
https://doi.org/10.1002/sia.5881
Autor:
Robert L. Opila, Thierry Conard, John T. Grant, Julia E. Fulghum, Keisuke Kobayashi, H. Nohira, Robert M. Wallace, J. Wolstenholme, G. Conti, Alberto Herrera-Gomez, László Kövér, Francisco S. Aguirre-Tostado, Wolfgang S. M. Werner, S. Oswald, R. W. Paynter, C. R. Brundle, M. Jenko, Peter J. Cumpson, Charles S. Fadley
Publikováno v:
Surface and Interface Analysis. 41:840-857
Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’ A. Herrera-Gomez,a,b∗ J. T. Grant,c P. J. Cumpson,d† M. Jenko,e F. S. Aguirre-Tostado,b C. R. Br
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1eea9e56f4a89b7ff5eb791f6f9a151d
https://doi.org/10.1002/sia.3105
https://doi.org/10.1002/sia.3105
Autor:
R. W. Paynter, M. Rondeau
Publikováno v:
Surface and Interface Analysis. 42:117-122
Angle-resolved X-ray photoelectron spectroscopy (ARXPS) data taken on a polystyrene film exposed to a nitrogen plasma are interpreted by the fitting of regularized depth profiles. Three ways of measuring the goodness of fit are compared—the χ2 sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::884921f8792edbe0d5639d071627dec1
https://doi.org/10.1002/sia.3173
https://doi.org/10.1002/sia.3173
Autor:
R. W. Paynter
Publikováno v:
Surface and Interface Analysis. 41:595-601
Polystyrene films were exposed to nitrogen plasmas for periods up to 8 min. Angle-resolved X-ray photoelectron spectroscopy measurements revealed the presence of oxygen and nitrogen in the surface due to the plasma treatment. The depth profiles of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a778b36f3a7fa9ae9ba2f492df9d156d
https://doi.org/10.1002/sia.3069
https://doi.org/10.1002/sia.3069