Zobrazeno 1 - 10
of 252
pro vyhledávání: '"R, Akselsson"'
Autor:
K. R. Akselsson, C-H Andersson, Orest Lastow, O Månsson, Håkan Andersson, Staffan Krantz, Mats Bohgard, Birger Christensson
Publikováno v:
Journal of Aerosol Science. 24:S17-S18
Autor:
Lin, Lingna, Zhong, Jiacheng
Publikováno v:
ASCE-ASME Journal of Risk & Uncertainty in Engineering Systems, Part A: Civil Engineering; Dec2024, Vol. 10 Issue 4, p1-13, 13p
Autor:
H. C. Kaufmann, R. Akselsson
Publikováno v:
Advances in X-ray Analysis. 18:353-361
A Fortran program for analysis of spectra obtained in proton induced x-ray emission spectroscopy is under development. The first version is working and some results are shown. The program uses a model which describes the physics involved in the analy
Publikováno v:
Journal of Radioanalytical Chemistry. 74:125-147
Specific advantages with Particle Induced X-Ray Emission are: its (1) multielemental capability, especially when combined with nuclear techniques for lighter elements, (2) speed, (3) low detection limits for small samples and (4) accuracy. To make fu
Autor:
K. R. Akselsson
Publikováno v:
IEEE Transactions on Nuclear Science. 28:1369-1373
The Second International Conference on Particle Induced X-ray Emission (PIXE) and its analytical applications was held in Lund, Sweden, June 9-12, 1980. About a hundred papers were presented, including seven invited talks (PIXE and particle scatterin
Autor:
Sven A. E. Johansson, K. R. Akselsson
Publikováno v:
IEEE Transactions on Nuclear Science. 26:1358-1362
Protons or a-particles from a 3 MV tandem Pelletron are used to induce characteristic x-rays, which are detected by a Si(Li)-detector. To optimize the quality and speed of data taking we use an absorber with a hole, pile-up rejection and on-demand be
Publikováno v:
Advances in X-ray Analysis. 15:373-387
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector, X-ray emission spectroscopy is shown to be capable of analysing many elements with Z > 15 simultaneously at the 10-12 g level, This work discusses a theoretica
Publikováno v:
Scanning electron microscopy. (Pt 4)
Proton-Induced X-ray Emission analysis (PIXE) constitutes a method for trace element analysis characterized by multielemental capability, detection limits in the low ppm-range and size resolution down towards a micrometre. In applications where the s
Publikováno v:
Scanning electron microscopy. (Pt 2)
The possibility of using the proton microprobe (PMP) in the elemental analysis of dermatological material, under conditions where the spatial resolution can be restricted to a few micrometers, was demonstrated. Comparison with the electron microprobe