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pro vyhledávání: '"Quiring, Kilian"'
Autor:
Montenegro, Iago Bischoff, Prikoszovich, Konrad, Lee, Subin, Quiring, Kilian, Zimmerman, Jonathan, Kirchlechner, Christoph
Scanning Electron Microscopy (SEM) is a widely used tool for nanoparticle characterization, but long-term directional drift can compromise image quality. We present a novel algorithm for post-imaging drift correction in SEM nanoparticle imaging. Our
Externí odkaz:
http://arxiv.org/abs/2410.23390
