Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Qiao, Ni Hai"'
Autor:
Feng, Lu Yong a, *, Min, Ren Zhong a, Qiao, Ni Hai a, Feng, He Zi a, Chan, D.S.H. a, Seng, Low Teck a, Yin, Chen Shao b, Gamani, Karunasiri c, Geng, Chen c, Kun, Li d
Publikováno v:
In Applied Surface Science 1999 138:494-498
Autor:
Liu J; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.; School of Physics, Sun-Yat Sen University, Guangzhou, 510275, China.; Maryland NanoCenter, University of Maryland, College Park, USA., Konthasinghe K; Department of Physics, University of South Florida, Tampa, Florida 33620, USA., Davanco M; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Lawall J; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Anant V; Photon Spot, Inc., Monrovia, CA 91016, USA., Verma V; National Institute of Standards and Technology, Boulder, CO 80305, USA., Mirin R; National Institute of Standards and Technology, Boulder, CO 80305, USA., Woo Nam S; National Institute of Standards and Technology, Boulder, CO 80305, USA., Dong Song J; Center for Opto-Electronic Materials and Devices Research, Korea Institute of Science and Technology, Seoul 136-791, South Korea., Ma B; State Key Laboratory for Superlattice and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences.; Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China (Dated: September 27, 2018)., Sheng Chen Z; State Key Laboratory for Superlattice and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences.; Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China (Dated: September 27, 2018)., Qiao Ni H; State Key Laboratory for Superlattice and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences.; Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China (Dated: September 27, 2018)., Chuan Niu Z; State Key Laboratory for Superlattice and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences.; Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China (Dated: September 27, 2018)., Srinivasan K; Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
Physical review applied [Phys Rev Appl] 2018; Vol. 9.