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pro vyhledávání: '"Qianxia Yao"'
Autor:
Yue Yu, Zeyi Ye, Li Jiang, Qianxia Yao, Shuangying Li, Jiali Wu, Jinlong Zhang, Qiushi Huang, Chun Xie, Andrey Sokolov, Hongjun Zhou, Tonglin Huo, Wenbin Li, Zhanshan Wang
A laboratory based reflectometer designed for characterizing the reflectivity of optical coatings in 30 to 200 nm wavelength range was recently developed at IPOE. An RF produced gas discharge light source is applied to generate characteristic lines.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c13ab53289127908d8f1f83cd3934301
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=108995
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=108995
