Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Qianwen Weng"'
Autor:
Ying Yu, Weiqiang Chen, Guangxing Ji, Yulong Guo, Yinan Chen, Siyu Sheng, Yaru Deng, Qianwen Weng
Publikováno v:
Frontiers in Environmental Science, Vol 12 (2024)
The study of agricultural non-point source pollution (ANNSP) patterns and driving mechanisms is crucial for regional ecological management. This paper evaluates the sources of ANNSP in the Huang-Huai-Hai Plain for the years 2000, 2010, and 2020 using
Externí odkaz:
https://doaj.org/article/4fd719671a99475b8f826a5f6ae36d45
Publikováno v:
Nanotechnology and Precision Engineering, Vol 2, Iss 2, Pp 77-82 (2019)
A white light spectral interferometry based on a Linnik type system was established to accurately measure the thin film thickness through transparent medium. In practical work, the equivalent thickness of a beam splitter and the mismatch of the objec
Externí odkaz:
https://doaj.org/article/f6d54de1307146b883746a82f9dd9b90
Publikováno v:
Nanotechnology and Precision Engineering, Vol 2, Iss 2, Pp 77-82 (2019)
A white light spectral interferometry based on a Linnik type system was established to accurately measure the thin film thickness through transparent medium. In practical work, the equivalent thickness of a beam splitter and the mismatch of the objec
Publikováno v:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems.
This paper presents a signal processing method based on continuous wavelet transform in our line-scan dispersive interferometric system. Our method enables us to extract phase information from the spectrum by applying continuous wavelet transform, wh
Publikováno v:
Optics and Lasers in Engineering. 137:106388
White-light dispersive interferometry (WLDI) is an instantaneous, high-resolution optical metrological technique for measuring precise and complicated surfaces. This method enables nondestructive inspection of transparent-film-structure devices that
Publikováno v:
Surface Topography: Metrology and Properties. 8:025028
Smile distortion caused by aberration of the optical system is the key factor that affects the spectral calibration of a white-light spectral interferometer. To improve the accuracy of surface metrology, this paper proposes a novel calibration approa
Surface measurement through transparent medium using Linnik type white-light spectral interferometer
Publikováno v:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018).
According to the requirement for high precision surface measurement in the special conditions, a Linnik type measuring system with long working distance was built up based on white-light microscopic spectral interferometry. The influence of the trans
Publikováno v:
Proceedings of SPIE; 9/12/2018, Vol. 10827, p1-9, 9p