Zobrazeno 1 - 7
of 7
pro vyhledávání: '"QUANG HUNG HOANG"'
Autor:
Luca Cressa, Jonas Fell, Christoph Pauly, Quang Hung Hoang, Frank Mücklich, Hans-Georg Herrmann, Tom Wirtz, Santhana Eswara
Publikováno v:
Microscopy and Microanalysis. 28:1890-1895
Correlative microscopy approaches are attracting considerable interest in several research fields such as materials and battery research. Recent developments regarding X-ray computer tomography have made this technique available in a compact module f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::24b97771182bb31a4bf4365157615879
https://doi.org/10.1017/s1431927622012405
https://doi.org/10.1017/s1431927622012405
Autor:
Jean-Nicolas Audinot, Alexander D Ost, Charlotte Stoffels, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Quang Hung Hoang, Tom Wirtz
Publikováno v:
Microscopy and Microanalysis. 28:944-946
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::464738db72fd58c4dbdd921c7c5efc5b
https://doi.org/10.1017/s1431927622004135
https://doi.org/10.1017/s1431927622004135
Akademický článek
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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging
Autor:
Jean-Nicolas Audinot, Alexander D Ost, Charlotte Stoffels, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Quang Hung Hoang, Tom Wirtz
Publikováno v:
Microscopy and Microanalysis. 28:30-31
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4932056c8ffe1ad8ca450ca3a040163a
https://doi.org/10.1017/s1431927622001039
https://doi.org/10.1017/s1431927622001039
Autor:
Santhana Eswara, Saba Tabean, Michael Mousley, Quang Hung Hoang, Olivier Bouton, Olivier De Castro, Eduardo Serralta, Nico Klingner, Gregor Hlawacek, Tom Wirtz
Publikováno v:
Microscopy and Microanalysis. 28:34-35
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f7ea582d38f24793e57ba03d30d3184
https://doi.org/10.1017/s1431927622001052
https://doi.org/10.1017/s1431927622001052
Autor:
Quang Hung Hoang, Jean-Nicolas Audinot, Antje Biesemeier, Olivier De Castro, Tom Wirtz, Patrick Philipp
Publikováno v:
Reports on Progress in Physics
This paper is a review on the combination between Helium Ion Microscopy (HIM) and Secondary Ion Mass Spectrometry (SIMS), which is a recently developed technique that is of particular relevance in the context of the quest for high-resolution high-sen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc0fc65d0b2ddb8e43fc7d1145d40f2f
Publikováno v:
Microscopy & Analysis - Asia; Jan/Feb2022, Issue 150, p16-19, 4p