Zobrazeno 1 - 10
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pro vyhledávání: '"Purser, Kenneth H."'
Publikováno v:
Physics Today.
Autor:
Purser, Kenneth H.
Publikováno v:
IEEE Transactions on Nuclear Science; 1973, Vol. 20 Issue 3, p383-386, 4p
Autor:
Purser, Kenneth H.
Publikováno v:
IEEE Transactions on Nuclear Science; 1973, Vol. 20 Issue 3, p136-141, 6p
Ion beams of MeV energy are in routine use as depth microscopes to determine composition and impurity profiles with depth resolutions of 100-300 Å over near-surface regions. Backscattering spectrometry with He ions and proton-induced x-rays are simp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od________38::56a47e74df8bb16876eca1c4563c2221
https://resolver.caltech.edu/CaltechAUTHORS:20120803-103105025
https://resolver.caltech.edu/CaltechAUTHORS:20120803-103105025
Publikováno v:
Physics Today; Apr2005, Vol. 58 Issue 4, p85-85, 7/8p, 1 Black and White Photograph
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 1987 258(3):437-442
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1990 52(3):424-427
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1987 21(1):285-295
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1996 113(1):445-452
Autor:
Purser, Kenneth H.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1994 92(1):201-206