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pro vyhledávání: '"Pulkit, Arya"'
Autor:
Jena, Sushovan, Pulkit, Arya, Singh, Kajal, Banerjee, Anoushka, Joshi, Sharad, Ganesh, Ananth, Singh, Dinesh, Bhavsar, Arnav
With the rapid advances in deep learning and smart manufacturing in Industry 4.0, there is an imperative for high-throughput, high-performance, and fully integrated visual inspection systems. Most anomaly detection approaches using defect detection d
Externí odkaz:
http://arxiv.org/abs/2407.02968